ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE

• US 20130081159A1
• Filed: 07/26/2012
• Published: 03/28/2013
• Est. Priority Date: 07/29/2011
• Status: Abandoned Application

• Current Assignee: Seagate Technology LLC (Seagate Technology Holdings Plc)
• Original Assignee: Seagate Technology LLC (Seagate Technology Holdings Plc)
• Inventors: Liu, Huiwen, Gunderson, Peter, Zhou, Lin
• Application Number:
  US13/559,034
• Publication Number:
  US 20130081159A1
• Time in Patent Office: Days
• US Class Current: 850/33
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 10/06 Circuits or algorithms therefor
• CPC Class Codes: G01Q 30/06 for error compensation
• CPC Class Codes: G01Q 60/24 AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes

Abstract

Advanced atomic force microscopy (AFM) methods and apparatuses are presented. An embodiment may comprise performing a first scan at a first angle, a second scan at a second angle, and correcting a system drift error in the first scan based on the second scan. Another embodiment may comprise performing a global scan of a first area, a local scan of a second area within the first area, correcting a leveling error in the local scan based on the global scan, and outputting a corrected sample image. Another embodiment may comprise performing a first scan at a first position at a first angle, a second scan at a flat region using the same scan angle and scan size to correct a scanner runout error in the first scan based on the second scan.

Claims

1. A method comprising:

performing a first atomic force microscope (AFM) scan of a sample at a first position at a first angle to produce a first scan image;

performing a second AFM scan of the sample at the first position at a second angle to produce a second scan image; and

correcting a first error in the first scan image based on the second scan image to produce a corrected image output.

2. The method of claim 1, wherein the second angle is perpendicular to the first angle, and wherein the first error comprises inaccuracy caused by drift during the first AFM scan and wherein the first error is corrected using a true 3D image flattening procedure.

3. The method of claim 1 further comprising:

performing a reference AFM scan of the sample at a second position offset from the first position at the first angle to produce a third scan image, wherein the second position comprises a portion of the sample that has a substantially level surface; and

correcting a bowing error in the first scan image based on the third scan image using image subtraction.

4. The method of claim 3 further comprising:

performing a third AFM scan of the sample at a third position at a third angle to produce a fourth scan image, wherein the third position is within an area of the first AFM scan and an area of the third AFM scan is smaller than the area of the first AFM scan; and

correcting a slope error in the fourth scan image based on the first scan image.

5. The method of claim 4 further comprising:

performing a fourth AFM scan of the sample at the third position at a fourth angle perpendicular to the third angle to produce a fifth scan image; and

correcting a system drift error in the fourth scan image based on the fifth scan image.

6. An apparatus comprising:

an atomic force microscopy (“

AFM”

) tool adapted to;

perform a first scan of a sample at a first position at a first angle;

perform a second scan of the sample at the first position at a second angle; and

correct a first error in the first scan based on the second scan.

7. The apparatus of claim 6, wherein the AFM tool is further adapted to:

perform a reference scan of the sample at a second position offset from the first position at the first angle, wherein the second position comprises a portion of the sample that has a substantially level surface; and

correct a bowing error in the first scan based on the reference scan.

8. The apparatus of claim 7, wherein the AFM tool is further adapted to:

perform a third scan of the sample at a third position at a third angle, wherein the third position is within an area of the first scan and an area of the third scan is smaller than the area of the first scan; and

;

correcting a slope error in the third scan based on the first scan.

9. The apparatus of claim 8, wherein the AFM tool is further adapted to:

perform a fourth scan of the sample at the third position at a fourth angle perpendicular to the third angle;

correcting a system drift error in the third scan based on the fourth scan; and

calculating a shape of the sample within the area of the third scan based on the third scan and the fourth scan.

10. A method comprising:

performing a first atomic force microscope (AFM) scan of a sample at a first position at a first angle to produce a first scan image;

performing a second AFM scan of the sample at a second position offset from the first position at the first angle to produce a second scan image, wherein the second position is located within a portion of the sample that has a substantially level surface; and

correcting a first error in the first scan image based on the second scan image.

11. The method of claim 10, further comprising:

performing a third AFM scan of the sample at the first position at a second angle perpendicular to the first angle to produce a third scan image; and

correcting a system drift error in the first scan image based on the third scan image.

12. The method of claim 11, wherein the first error includes a bowing error, and correcting the first error in the first scan image comprises using image subtraction based on the second scan image;

and wherein correcting the system drift error based on the third scan image comprises using a true 3D image flattening procedure.

13. The method of claim 11 further comprising:

performing a fourth AFM scan of the sample at a third position at a third angle to produce a fourth scan image, wherein the third position is within an area of the first AFM scan and an area of the fourth AFM scan is smaller than the area of the first AFM scan; and

correcting a slope error in the fourth scan image based on the first scan image.

14. The method of claim 13 further comprising:

performing a fifth AFM scan of the sample at the third position at a fourth angle perpendicular to the third angle to produce a fifth scan image; and

correcting a system drift error in the fourth scan image based on the fifth scan image.

15. An apparatus comprising:

an atomic force microscopy (“

AFM”

) tool adapted to;

perform a first scan of a sample at a first position at a first angle;

performing a second scan of the sample at a second position offset from the first position at the first angle, wherein the second position comprises a flat reference point of the sample; and

correcting a first error in the first scan based on the second scan.

16. The apparatus of claim 15, wherein the AFM tool is further adapted to:

perform a third scan of the sample at the first position at a second angle; and

correct a system drift error in the first scan based on the third scan.

17. The apparatus of claim 16, further comprising:

the first error includes a bowing error, and the AFM tool is adapted to correct the first error in the first scan using image subtraction based on the second scan;

the AFM tool is further adapted to correct the system drift error based on the third scan using a true 3D image subtraction procedure; and

the AFM tool produces a corrected image of the sample at a visual output.

18. The apparatus of claim 17, wherein the AFM tool is further adapted to:

perform a fourth scan of the sample at a third position at a third angle, wherein the third position is within an area of the first scan and an area of the fourth scan is smaller than the area of the first scan; and

correct a slope error in the fourth scan based on the first scan.

19. The apparatus of claim 18, wherein the AFM tool is further adapted to:

perform a fifth scan of the sample at the third position at a fourth angle perpendicular to the third angle; and

correcting a system drift error in the fourth scan based on the fifth scan.

20. A method comprising:

performing a global atomic force microscope (AFM) scan of a first selected area of a sample at a first position, the global AFM scan including a larger area of the sample than a local AFM scan;

performing the local AFM scan of a second selected area of the sample at a second position, the second selected area including a smaller area within the first selected area;

correcting a slope error in the local AFM scan based on the global AFM scan; and

outputting a corrected sample image based on the global AFM scan, the local AFM scan, and the step of correcting.

21. The method of claim 20 wherein performing the global AFM scan comprises:

performing a first global AFM scan of the sample at the first position at a first angle;

performing a second global AFM scan of the sample at the first position at a second angle perpendicular to the first angle; and

correcting a system drift error in the first global AFM scan based on the second global AFM scan.

22. The method of claim 21 further comprising:

performing a reference AFM scan of the sample at a third position offset from the first position at the first angle, wherein the third position comprises a portion of the sample that has a substantially level surface; and

correcting a run out error in the global AFM scan based on the reference AFM scan.

23. The method of claim 22 wherein performing the local AFM scan comprises:

performing a first local AFM scan of the sample at the second position at a third angle;

performing a second local AFM scan of the sample at the second position at a fourth angle perpendicular to the third angle of the first local AFM scan; and

correcting a system drift error in the first local AFM scan based on the second local AFM scan.

24. The method of claim 23 wherein

correcting the run out error in the global AFM scan based on the reference AFM scan comprises using image subtraction;

correcting the system drift error in the first global AFM scan based on the second global AFM scan and correcting the system drift error in the first local AFM scan based on the second local AFM scan comprises using a true 3D image flattening procedure; and

further comprising calculating a shape of the sample within the area of the local AFM scan based on the global AFM scan, the local AFM scan, and the correcting steps.

25. An apparatus comprising:

an atomic force microscopy (“

AFM”

) tool adapted to;

perform a global scan of a sample at a first position, the global scan including a larger area of the sample than a local scan;

perform the local scan at a second position, wherein the second position is within an area of the global scan and an area of the local scan is smaller than the area of the global scan; and

correct a slope error in the local scan based on the global scan.

26. The apparatus of claim 25, wherein the global scan comprises:

performing a first global scan of the sample at the first position at a first angle;

performing a second global scan of the sample at the first position at a second angle perpendicular to the first angle; and

correcting a system drift error in the first global scan based on the second global scan.

27. The apparatus of claim 26, wherein the AFM tool is further configured to:

perform a reference scan of the sample at a third position offset from the first position at the first angle, wherein the third position comprises a portion of the sample that has a substantially level surface; and

correct a run out error in the global scan based on the reference scan.

28. The apparatus of claim 27, wherein the local scan comprises:

performing a first local scan of the sample at the second position at a third angle;

performing a second local scan of the sample at the second position at a fourth angle perpendicular to the third angle of the first local scan; and

correcting a system drift error in the first local scan based on the second local scan using a true 3D image flattening procedure.

29. The apparatus of claim 28 wherein

correcting the run out error in the global scan based on the reference scan comprises using image subtraction;

and

correcting the system drift error in the first global scan based on the second global scan and correcting the system drift error in the first local scan based on the second local scan comprises using a true 3D image flattening procedure.

30. The apparatus of claim 29, wherein the AFM tool is further adapted to:

calculate a shape of the sample within the area of the local scan based on the global scan, the local scan, and processes to correct the global scan and the local scan.