METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY
First Claim
1. An incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample, comprising:
- a source for emitting an incident wave having a given spectral band;
an interference device comprising a reference arm and an object arm, to provide optical interference between a reference wave obtained by reflection of the incident wave on a reflective surface of the reference arm and an object wave obtained by the backscattering of the incident wave by a slice of the sample at a given depth of said sample, when said sample is placed in an object focal plane of a microscope objective placed in the object arm;
a device for multichannel acquisition of at least a first interference signal and at least a second interference signal resulting from the optical interference of said reference and object waves, the at least two interference signals having a phase difference produced by varying the relative path length difference between the two arms of the interference device, said device for multichannel acquisition being placed in a plane optically conjugated with said object focal plane of said microscope objective of the object arm; and
a processing unit for calculating an image of the slice of the sample based on said first and second interference signals, whereinthe interference device additionally comprises an optical element for modifying the phase of the wavefront of one of said reference or object waves, andthe microscopy device comprises a control unit for the optical element, linked to the processing unit, the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.
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Abstract
The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.
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Citations
14 Claims
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1. An incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample, comprising:
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a source for emitting an incident wave having a given spectral band; an interference device comprising a reference arm and an object arm, to provide optical interference between a reference wave obtained by reflection of the incident wave on a reflective surface of the reference arm and an object wave obtained by the backscattering of the incident wave by a slice of the sample at a given depth of said sample, when said sample is placed in an object focal plane of a microscope objective placed in the object arm; a device for multichannel acquisition of at least a first interference signal and at least a second interference signal resulting from the optical interference of said reference and object waves, the at least two interference signals having a phase difference produced by varying the relative path length difference between the two arms of the interference device, said device for multichannel acquisition being placed in a plane optically conjugated with said object focal plane of said microscope objective of the object arm; and a processing unit for calculating an image of the slice of the sample based on said first and second interference signals, wherein the interference device additionally comprises an optical element for modifying the phase of the wavefront of one of said reference or object waves, and the microscopy device comprises a control unit for the optical element, linked to the processing unit, the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of incoherent light full field interference microscopy for the imaging of a volumetric scattering sample, comprising:
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emission of an incident wave having a given spectral band; optical interference between a reference wave obtained by reflection of the incident wave on a mirror of a reference arm of the interference device and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of said sample, the sample being placed in an object focal plane of a microscope objective placed in an object arm of the interference device; acquisition using a multichannel acquisition device, placed in a plane optically conjugated with said object focal plane of said microscope objective of the object arm, of at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference produced by varying the relative path length difference between the two arms of the interference device; processing of the first and second interference signals for calculating an image of the slice of the sample; and control of the phase of the wave incident on the sample by optimizing a statistical parameter of at least a part of the image calculated on the basis of the processing of the interference signals. - View Dependent Claims (11, 12, 13, 14)
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Specification