PROTECTIVE SEMICONDUCTOR APPARATUS FOR AN ASSEMBLED BATTERY, A BATTERY PACK INCLUDING THE PROTECTIVE SEMICONDUCTOR APPARATUS, AND AN ELECTRONIC DEVICE

• US 20130113493A1
• Filed: 07/07/2011
• Published: 05/09/2013
• Est. Priority Date: 07/14/2010
• Status: Abandoned Application

• Current Assignee: RICOH Electronic Devices Co., Ltd. (Nisshinbo Holdings Incorporated)
• Original Assignee: RICOH Electronic Devices Co., Ltd. (Nisshinbo Holdings Incorporated)
• Inventors: Kanno, Junichi
• Application Number:
  US13/808,961
• Publication Number:
  US 20130113493A1
• Time in Patent Office: Days
• US Class Current: 324/426
• CPC Class Codes: G01R 31/54 Testing for continuity
• CPC Class Codes: H01M 10/48 Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte constructional details of current conducting connections for detecting conditions inside cells or batteries, e.g. details of voltage sensing terminals, H01M50/569
• CPC Class Codes: H02H 7/18 for batteries; for accumulators
• CPC Class Codes: H02J 7/0013 acting upon several batteries simultaneously or sequentially H02J7/1423 takes precedence
• CPC Class Codes: H02J 7/00304 Overcurrent protection
• CPC Class Codes: H02J 7/00308 Overvoltage protection
• CPC Class Codes: H02J 7/0031 using battery or load disconnect circuits H02J9/002 takes precedence
• CPC Class Codes: Y02E 60/10 Energy storage using batteries

Abstract

A protective semiconductor apparatus for protecting an assembled battery including N secondary cells connected in series includes a disconnection detecting circuit including, for each of the N secondary cells, a voltage-sensing resistor dividing a voltage of a corresponding one of the secondary cells, a reference voltage, and a first comparator comparing a voltage obtained by the voltage-sensing resistor with the reference voltage. The protection semiconductor apparatus also includes a circuit connecting an internal resistor having a resistance value smaller than a resistance value of a corresponding one of the voltage-sensing resistors in parallel to the corresponding voltage-sensing resistors successively and selectively at predetermined time intervals. The disconnection detecting circuit detects disconnection between the N secondary cells and the protective semiconductor apparatus based on an output from the first comparator when the internal resistor is connected in parallel to the corresponding voltage-sensing resistor.

Claims

1. A protective semiconductor apparatus for protecting an assembled battery including N secondary cells connected in series, the protective semiconductor apparatus comprising:

a disconnection detecting circuit including, for each of the N secondary cells, a voltage-sensing resistor configured to divide a voltage of the secondary cells;

a reference voltage; and

a first comparator configured to compare a voltage obtained by the voltage-sensing resistor with the reference voltage; and

a circuit configured to connect an internal resistor having a resistance value smaller than a resistance value of a corresponding one of the voltage-sensing resistors in parallel to the corresponding voltage-sensing resistors successively and selectively at predetermined time intervals,

wherein the disconnection detecting circuit is configured to detect disconnection between the N secondary cells and the protective semiconductor apparatus based on an output from the first comparator when the internal resistor is connected in parallel to the corresponding voltage-sensing resistor.

2. The protective semiconductor apparatus according to claim 1, further comprising:

a high-voltage detecting circuit including a second comparator configured to invert an output from the second comparator when the cell voltage of any one of the N secondary cells is increased to or above a predetermined first voltage; and

/or

a low-voltage detecting circuit including a third comparator configured to invert an output from the third comparator when the cell voltage of any of the N secondary cells is decreased to or below a predetermined second voltage.

3. The protective semiconductor apparatus according to claim 2, wherein the voltage-sensing resistors and the reference voltages in the disconnection detecting circuit are shared with the high-voltage detecting circuit or the low-voltage detecting circuit, and

wherein the first comparator in the disconnection detecting circuit is shared as the second comparator in the high-voltage detecting circuit and/or as the third comparator in the low-voltage detecting circuit.

4. The protective semiconductor apparatus according to claim 3, wherein the first voltage in the high-voltage detecting circuit and the second voltage in the low-voltage detecting circuit are set by the voltage-sensing resistor and the reference voltage.

5. The protective semiconductor apparatus according to claim 1, wherein the circuit that connects the internal resistors to the corresponding voltage-sensing resistors successively and selectively is configured to connect a series circuit of the internal resistor and a switch in parallel to the corresponding voltage-sensing resistor and configured to turn on the switches successively and selectively.

6. The protective semiconductor apparatus according to claim 3, further comprising a determination circuit configured to determine disconnection between the N secondary cells and the protective semiconductor apparatus, an increase of the cell voltage of any of the N secondary cells to or above the first voltage, and/or a decrease of the cell voltage of any of the N secondary cells to or below the second voltage, based on the output from the first comparator, or the output from the first comparator and a timing signal for successively and selectively turning on the switches.

7. The protective semiconductor apparatus according to claim 6, wherein the determination circuit is configured to determine which power supply terminal of the N secondary cells is disconnected from the protective semiconductor apparatus.

8. The protective semiconductor apparatus according to claim 1, further comprising a circuit configured to detect disconnection between the protective semiconductor apparatus and a positive-electrode power-supply terminal of an upper-most one of the N secondary cells connected in series and/or a negative-electrode power-supply terminal of a lower-most one of the N secondary cells connected in series.

9. The protective semiconductor apparatus according to claim 8, wherein the circuit that detects disconnection between the positive-electrode power-supply terminal and the protective semiconductor apparatus includes an inverter configured to receive a potential at the positive-electrode power-supply connecting terminal.

10. The protective semiconductor apparatus according to claim 8, wherein the circuit configured to detect disconnection between the negative-electrode power-supply terminal and the protective semiconductor apparatus includes an inverter configured to receive a potential at the negative-electrode power-supply terminal.

11. The protective semiconductor apparatus according to claim 8, wherein the circuit configured to detect disconnection between the positive-electrode power-supply connecting terminal and the protective semiconductor apparatus includes a fourth comparator configured to receive a potential at the positive-electrode power-supply connecting terminal as an inverting input and a potential at a negative-electrode cell connecting terminal of the upper-most secondary cell as a non-inverting input.

12. The protective semiconductor apparatus according to claim 8, wherein the circuit configured to detect disconnection between the negative-electrode power-supply terminal and the protective semiconductor apparatus includes a fifth comparator configured to receive a potential at the negative-electrode power-supply terminal as a non-inverting input and a potential at a positive-electrode cell-connecting terminal of the lower-most secondary cell an inverting input.

13. The protective semiconductor apparatus according to claim 8, wherein the determination circuit is configured to detect disconnection between the positive-electrode power-supply connecting terminal and the protective semiconductor apparatus or disconnection between the negative-electrode power-supply terminal and the protective semiconductor apparatus.

14. The protective semiconductor apparatus according to claim 1, further comprising an oscillating circuit configured to set the time intervals at which the internal resistors are connected to the corresponding secondary cells successively and selectively.

15. The protective semiconductor apparatus according to claim 1, wherein the time intervals at which the internal resistors are connected to the corresponding secondary cells successively and selectively are controlled by adjusting the intervals of input of an external trigger signal.

16. The protective semiconductor apparatus according to claim 1, wherein the time intervals at which the internal resistors are connected to the corresponding secondary cells successively and selectively are set by an externally provided capacitor.

17. A battery pack comprising the protective semiconductor apparatus according to claim 1.

18. An electronic device comprising the protective semiconductor apparatus according to claim 1.