COMPOSITE SUBSTRATE, ELECTRONIC COMPONENT, AND METHOD FOR MANUFACTURING COMPOSITE SUBSTRATE, AND METHOD FOR MANUFACTURING ELECTRONIC COMPONENT

• US 20130119519A1
• Filed: 07/29/2011
• Published: 05/16/2013
• Est. Priority Date: 07/30/2010
• Status: Abandoned Application

• Current Assignee: Kyocera Corporation
• Original Assignee: Kyocera Corporation
• Inventors: Kitada, Masanobu
• Application Number:
  US13/813,308
• Publication Number:
  US 20130119519A1
• Time in Patent Office: Days
• US Class Current: 257/618
• CPC Class Codes: H01L 21/76251 using bonding techniques
• CPC Class Codes: H01L 21/78 with subsequent division of the substrate into plural individual devices cutting to change the surface-physical characteristics or shape of semiconductor bodies H01L21/304
• CPC Class Codes: H01L 27/12 the substrate being other than a semiconductor body, e.g. an insulating body
• CPC Class Codes: H01L 29/04 characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes characterised by physical imperfections H01L29/30

Abstract

Provided are a composite substrate which includes a silicon substrate having improved crystallinity, a method for manufacturing a composite substrate, and a method for manufacturing an electronic component. A composite substrate is formed by bonding a semiconductor substrate onto a support substrate having electric insulating properties. The semiconductor substrate is formed of silicon. The semiconductor substrate includes a plurality of first regions on each of which an element portion which functions as a semiconductor device is formed, and a second region which is positioned between the plurality of first regions. In the semiconductor substrate, an oxidized portion which is composed of silicon oxide is formed on a bottom surface of the second region.

Claims

1. A composite substrate, comprising:

a support substrate having electric insulating properties; and

a silicon substrate disposed on the support substrate, the silicon substrate comprising a plurality of first regions and a second region positioned between the plurality of first regions,

an oxidized portion containing silicon oxide as a main component, the oxidized portion being disposed on a main surface of the second region closer to the support substrate side.

2. The composite substrate according to claim 1,

wherein the support substrate is a single crystal containing aluminum oxide as a main component.

3. The composite substrate according to claim 1,

wherein the oxidized portion surrounds circumference of the plurality of first regions.

4. The composite substrate according to claim 1,

wherein the oxidized portion penetrates the silicon substrate in a thickness direction thereof.

5. The composite substrate according to claim 1,

wherein the oxidized portion is exposed from a side surface of the silicon substrate.

6. The composite substrate according to claim 1,

wherein the oxidized portion is positioned inside other surfaces excluding a main surface of the silicon substrate closer to the support substrate side.

7. The composite substrate according to claim 1,

wherein second oxidized portions which are thinner than the oxidized portion are positioned on the main surfaces of the plurality of first regions closer to the support substrate side.

8. The composite substrate according to claim 1,

wherein bonding strength between the second region and the support substrate is larger than bonding strength between the plurality of first regions and the support substrate.

14. A method for manufacturing an electronic component, further comprising:

a step of forming a plurality of element portions which function as a semiconductor device corresponding to the plurality of first regions in the composite substrate according to claim 1; and

a step of dividing the composite substrate into regions each of which includes at least one of the plurality of element portions.

15. The method for manufacturing an electronic component according to claim 14,

wherein the composite substrate is divided in such a manner that the second region is exposed in divided surfaces formed by dividing the composite substrate in the step of dividing the composite substrate.

9. A method for manufacturing a composite substrate, comprising:

an oxidized portion forming step of providing an oxidized portion containing silicon oxide as a main component, on a surface of a second region in a silicon substrate comprising a plurality of first regions and the second region positioned between the plurality of first regions; and

a bonding step of bonding the oxidized portion of the silicon substrate to a support substrate having electric insulating properties.

10. The method for manufacturing a composite substrate according to claim 9,

wherein the oxidized portion is formed by oxidizing the surface of the second region in the silicon substrate in the oxidized portion forming step.

11. The method for manufacturing a composite substrate according to claim 9,

wherein the oxidized portion forming step comprises:

a step of forming an oxidized layer containing silicon oxide as a main component on the silicon substrate, and

a step of forming the plurality of first regions exposed from the oxidized layer and a second region which comprises the oxidized portion formed by removing a portion of the oxidized layer on the surface, on the silicon substrate.

12. The method for manufacturing a composite substrate according to claim 9,

wherein the oxidized portion forming step includes:

a step of forming a first oxidized layer which covers the plurality of first regions on the silicon substrate, leaving the second region exposed,

a step of oxidizing surfaces of the plurality of first regions covered with the first oxidized layer and the surface of the second region which is not covered with the first oxidized layer, remaining unoxidized portions as they are, and of forming a second oxidized layer which covers the plurality of first regions and the second region in which the first oxidized layer and newly oxidized region are combined, and

a step of etching the second oxidized layer up to surfaces of the unoxidized portions of the plurality of first regions which are exposed and of preparing the oxidized portion composed of an exposed remaining portion of the second oxidized layer.

13. The method for manufacturing a composite substrate according to claim 9,

wherein second oxidized portions, which are thinner than the oxidized portion, are formed on surfaces of the plurality of first regions in the silicon substrate using natural oxidation.

16. An electronic component, comprising:

a support chip having electric insulating properties; and

a silicon chip disposed on the support chip, wherein the silicon chip comprises a first region on which an element portion which functions as a semiconductor device is formed, and a second region which is disposed surrounding the first region,

an oxidized portion containing silicon oxide as a main component which is disposed on a main surface of the second region closer to the support chip side.

17. The electronic component according to claim 16,

wherein the second region covers an entire outer circumferential side surface of the silicon chip.

18. The electronic component according to claim 16,

wherein a total of thicknesses of the oxidized portion and the element portion is larger than a thickness of the silicon chip.