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TEMPERATURE DETECTION CIRCUIT AND METHOD OF ADJUSTING THE SAME

  • US 20130121377A1
  • Filed: 10/25/2012
  • Published: 05/16/2013
  • Est. Priority Date: 11/11/2011
  • Status: Active Grant
First Claim
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1. A temperature detection circuit for generating a temperature detection signal indicating a temperature of a semiconductor, comprising:

  • first and second diodes having respective p-n junctions independent from each other;

    a first current path including a first variable voltage dividing resistor that is connected in series to the first diode and whose dividing resistance ratio is variable according to a first offset adjustment signal;

    a second current path including a second variable voltage dividing resistor that is connected in series to the second diode and whose dividing resistance ratio is variable according to a second offset adjustment signal;

    a reference voltage generation part that feeds back a differential voltage to each of the first and second current paths and outputs the differential voltage as a reference voltage, the differential voltage indicating a difference between a first divided voltage divided by the first variable voltage dividing resistor and a potential on the second current path; and

    a temperature detection signal generation part that generates the temperature detection signal on the basis of a second divided voltage divided by the second variable voltage dividing resistor.

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