X-RAY ANALYSIS APPARATUS

• US 20130136236A1
• Filed: 10/10/2012
• Published: 05/30/2013
• Est. Priority Date: 11/24/2011
• Status: Active Grant

• Current Assignee: Rigaku Corporation
• Original Assignee: Rigaku Corporation
• Inventors: MORIKAWA, Keiichi, YOSHIDA, Hiroki
• Granted Patent: US 9,128,029 B2
• Time in Patent Office: Days
• US Class Current: 378/98.2
• CPC Class Codes: G01N 2223/306 computer control
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Abstract

An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the apparatus having: measurement software for implementing each of the individual measurement methods and acquiring measurement data; analysis software for performing a predetermined analysis on the measurement data and acquiring analysis data; reduced-size-image-creating means for creating a reduced-size image on the basis of each item of the measurement data and the analysis data; analysis-icon-creating means for creating an icon for denoting the analysis software; and image display means for displaying the reduced-size image and the icon on the same screen while indicating that the reduced-size image and the icon are correlated.

Claims

1. An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented,

the X-ray analysis apparatus having:

measurement software for implementing each of the individual measurement methods and acquiring measurement data;

analysis software for performing a predetermined analysis on the measurement data and acquiring analysis data;

reduced-size-image-creating means for creating a reduced-size image on the basis of each item of the measurement data and the analysis data;

analysis-icon-creating means for creating an icon for denoting the analysis software; and

image display means for displaying the reduced-size image and the icon on the same screen while indicating that the reduced-size image and the icon are correlated.

2. The X-ray analysis apparatus according to claim 1, wherein

displaying the correlation between the reduced-size image and the icon involves

displaying the icon adjacent to the reduced-size image, or

having a portion of the icon overlap a portion of the reduced-size image in the display.

3. The X-ray analysis apparatus according to claim 2, wherein the reduced-size image is displayed in accordance with image data created directly on the basis of the measurement data.

4. The X-ray analysis apparatus according to claim 3, wherein the analysis-icon-creating means creates the icon according to information inputted by the user.

5. The X-ray analysis apparatus according to claim 4, wherein the analysis-icon-creating means identifies the analysis software on the basis of an item notated in a file header portion of the measurement data, or an extension on the measurement data;

or an item notated in a file header portion of the analysis data, or an extension on the analysis data.

6. The X-ray analysis apparatus according to claim 5, wherein the analysis-icon-creating means identifies the analysis software on the basis of a notation of a measurement method ID recorded in the file header portion of the measurement data or a notation of an analysis software ID recorded in the file header portion of the analysis data.

7. The X-ray analysis apparatus according to claim 5, wherein the analysis-icon-creating means identifies the analysis software on the basis of a measurement condition notated in the file header portion of the measurement data or a measurement condition notated in the file header portion of the analysis data.

8. The X-ray analysis apparatus according to claim 1, wherein the reduced-size image is displayed in accordance with image data created directly on the basis of the measurement data.

9. The X-ray analysis apparatus according to claim 1, wherein the analysis-icon-creating means creates the icon according to information inputted by the user.

10. The X-ray analysis apparatus according to claim 1, wherein the analysis-icon-creating means identifies the analysis software on the basis of an item notated in a file header portion of the measurement data, or an extension on the measurement data;

or an item notated in a file header portion of the analysis data, or an extension on the analysis data.