METHOD FOR CALIBRATING TEMPERATURE SENSORS USING REFERENCE VOLTAGES

• US 20130144549A1
• Filed: 12/01/2011
• Published: 06/06/2013
• Est. Priority Date: 12/01/2011
• Status: Abandoned Application

• Current Assignee: ATI Technologies ULC (Advanced Micro Devices, Inc.)
• Original Assignee: Kristina Au
• Inventors: Temkine, Grigori, Chekmazov, Filipp, Edelshteyn, Paul, Drapkin, Oleg, Au, Kristina
• Application Number:
  US13/309,223
• Publication Number:
  US 20130144549A1
• Time in Patent Office: Days
• US Class Current: 702/99
• CPC Class Codes: G01K 15/005 Calibration
• CPC Class Codes: G01K 7/01 using semiconducting elements having PN junctions G01K7/02, G01K7/16, G01K7/30 take precedence

Abstract

A system and method for calibrating integrated circuit (IC) temperature measurement circuits. An integrated circuit (IC) includes a thermal sensor and data processing circuitry. The IC may have a temperature measurement mode of operation and a calibration mode of operation. During the calibration mode, one or more stable reference voltages, rather than sensed voltages from a thermal sensor, are selected as input voltages to the data processing circuitry. Electronic components within the data processing circuitry receive the stable reference voltages and generate a temperature digital code. The generated temperature digital code may be compared to an expected temperature digital code based on theoretical ideal gains for each of the components within the data processing circuitry. The comparison leads to an updated value for a scaling factor to be stored and used in subsequent temperature measurements.

Claims

1. A temperature measurement circuit comprising:

data processing circuitry configured to;

select one or more reference voltages as input voltages, in response to detecting a calibration mode of operation; and

generate a temperature value based on the input voltages; and

calibration circuitry configured to;

generate the one or more reference voltages; and

determine a scaling factor by calculating a ratio of an expected temperature value to the generated temperature value, in response to detecting a calibration mode of operation.

2. The temperature measurement circuit as recited in claim 1, further comprising a thermal sensor circuit configured to generate one or more sense voltages, wherein the data processing circuitry is further configured to select the one or more sense voltages as input voltages, in response to detecting a measurement mode of operation.

3. The temperature measurement circuit as recited in claim 2, wherein in response to detecting a measurement mode of operation, the data processing circuitry is further configured to adjust the temperature value according to the scaling factor.

4. The temperature measurement circuit as recited in claim 3, wherein the data processing circuitry comprises a plurality of data processing components, each with an associated gain.

5. The temperature measurement circuit as recited in claim 4, wherein the expected temperature value is a value based on the reference voltages and generated by the data processing circuitry.

6. The temperature measurement circuit as recited in claim 3, wherein adjusting the temperature value comprises multiplying the temperature value and the scaled factor.

7. The temperature measurement circuit as recited in claim 3, wherein the one or more generated sense voltages are associated with a given area of an integrated circuit.

8. The temperature measurement circuit as recited in claim 3, wherein the calibration circuitry is further configured to utilize a bandgap circuit to generate the one or more reference voltages.

9. A method comprising:

generating one or more reference voltages;

selecting the one or more reference voltages as input voltages to data processing circuitry, in response to detecting a calibration mode of operation;

generating a temperature value based on the input voltages;

in response to detecting a calibration mode of operation, determining a scaling factor by calculating a ratio of an expected temperature value to the generated temperature value.

10. The method as recited in claim 9, further comprising:

generating one or more sense voltages with a thermal sensor circuit; and

selecting the one or more sense voltages as input voltages to data processing circuitry, in response to detecting a measurement mode of operation.

11. The method as recited in claim 10, wherein in response to detecting a measurement mode of operation, the method further comprises adjusting the temperature value according to the scaled factor.

12. The method as recited in claim 11, wherein the data processing circuitry comprises a plurality of data processing components, each with an associated gain.

13. The method as recited in claim 12, wherein the expected temperature value is a value based on the reference voltages and generated by the data processing circuitry.

14. The method as recited in claim 11, further comprising adjusting the temperature value by multiplying the temperature value and the scaled factor.

15. The method as recited in claim 11, further comprising utilizing a bandgap circuit to generate the one or more reference voltages.

16. The method as recited in claim 11, further comprising generating the temperature value as a digital code.

17. A computer system comprising:

an integrated circuit (IC) comprising an on-die temperature measurement circuit configured to;

generate one or more reference voltages;

select the one or more reference voltages as input voltages to data processing circuitry, in response to detecting a calibration mode of operation;

generate a temperature value based on the input voltages;

in response to detecting a calibration mode of operation, determine a scaling factor by calculating a ratio of an expected temperature value to the generated temperature value; and

a thermal cooling controller configured to;

receive the generated temperature value; and

change a condition of operation for the IC in response to determining the temperature value exceeds a given threshold.

18. The computer system as recited in claim 17, wherein the temperature measurement circuit is further configured to:

generate one or more sense voltages with a thermal sensor circuit; and

select the one or more sense voltages as input voltages to data processing circuitry, in response to detecting a measurement mode of operation.

19. The computer system as recited in claim 18, wherein in response to detecting a measurement mode of operation, the temperature measurement circuit is further configured to adjust the temperature value according to the scaled factor.

20. The computer system as recited in claim 19, wherein changing the condition of operation by the thermal cooling controller comprises at least one of the following:

selecting a lower performance-power state and increasing a speed of a fan.

21. An integrated circuit comprising:

a thermal detector circuit configured to operate in at least a calibration mode and an operational mode;

wherein when operating in a calibration mode, the thermal detector circuit is configured to determine an adjustment value based on a difference between a first value generated by the thermal detector using a reference voltage and an expected value associated with the reference voltage;

wherein when operating in the operational mode, the thermal detector circuit is configured to adjust a second value generated based on a voltage generated at a thermal sensor using the adjustment value to generate a third value, the third value representing a temperature at a location of the integrated circuit.

22. The integrated circuit as recited in claim 21, wherein the adjustment value represents a value used to correct for gain mismatches in the integrated circuit.

23. The integrated circuit as recited in claim 22, wherein the adjustment value may be used as at least one of a multiplicative, divisive, additive, subtractive, or offset value.