LUMINANCE TEST SYSTEM FOR LEDS

• US 20130162283A1
• Filed: 08/28/2012
• Published: 06/27/2013
• Est. Priority Date: 12/26/2011
• Status: Abandoned Application

• Current Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Inventors: WANG, KANG-BIN
• Application Number:
  US13/596,162
• Publication Number:
  US 20130162283A1
• Time in Patent Office: Days
• US Class Current: 324/762.07
• CPC Class Codes: G01J 1/0214 Constructional arrangements for removing stray light
• CPC Class Codes: G01J 2001/4252 for testing LED's
• CPC Class Codes: G01R 31/2635 Testing light-emitting diodes, laser diodes or photodiodes

Abstract

A test system for Light-emitting diodes (LEDs) includes a microcontroller, a plurality of light sensors, a plurality of shielding members and a display module. Each of the plurality of light sensors is connected to the microcontroller and each of LEDs. Each of the plurality of light sensors is capable of detecting luminance of the plurality of LEDs respectively. Each of the plurality of shielding members is configured to prevent light outside of each of the plurality of shielding members from interfering with light emitted from each of the LEDs inside of each of the plurality of shielding members. The microcontroller is adapted to read light intensities sensed by the plurality of light sensors according to a predetermined sequence and send the light intensities to the display module to display the light intensities in the predetermined sequence.

Claims

1. A test system for light-emitting diodes (LEDs) comprising:

a microcontroller;

a plurality of light sensors, each of the plurality of light sensors being connected to the microcontroller and each of the LEDs;

a plurality of shielding members, each of the plurality of shielding members being configured to receive each the plurality of light sensors and each of the LEDs connected to each of the plurality of light sensors; and

a display module;

wherein each of the plurality of light sensors is connected to each of the LEDs and capable of detecting luminance of each of the LEDs;

each of the plurality of shielding members is configured to prevent light outside of each of the plurality of shielding members from interfering with light emitted from each of the LEDs inside of each of the plurality of shielding members;

the microcontroller is adapted to read light intensities sensed by the plurality of light sensors according to a predetermined sequence and send the light intensities to the display module to display the light intensities in the predetermined sequence.

2. The test system for LEDs of claim 1, wherein the microcontroller comprises a time controlling module, each of the plurality of light sensors is connected to the time controlling module, and the time controlling module is configured to control a transmitting sequence of output signals outputted by the plurality of light sensors.

3. The test system for LEDs of claim 2, wherein the microcontroller further comprises an analog to digital (AD) transferring module connected to the time controlling module, and the AD transferring module transfers analogue light intensities outputted by the plurality of light sensor to digital light intensities according to the predetermined sequence.

4. The test system for LEDs of claim 3, wherein the microcontroller further comprises a storage module connected to the AD transferring module, and the storage module saves each of the digital light intensities outputted by the AD transferring module to an address.

5. The test system for LEDs of claim 4, wherein the microcontroller comprises a central processing unit (CPU) connected to the storage module, the CPU reads a digital light intensities of the digital light intensities according to the address and display the digital light intensity and the LED detected by one of the plurality of light sensors.

6. The test system for LEDs of claim 1, wherein each of the plurality of light sensors is connected to the microcontroller by a signal line, each of the plurality of shielding members defines a first through hole, and the signal line extends through the first through hole.

7. The test system for LEDs of claim 6, further comprising a plurality of power wires, wherein each of the plurality of power wires is connected to each of the LEDs, each of the plurality of shielding members further defines a second through hole, and each of the plurality of power wires extends through each of the second through hole.

8. The test system for LEDs of claim 7, wherein a diameter of each of the plurality of power lines is substantially equal to a diameter of each of the second through hole.

9. The test system for LEDs of claim 1, wherein each of the plurality of shielding members is substantially taper-shaped.

10. The test system for LEDs of claim 1, further comprising an absorbing plate on each of the plurality of shielding members, and the absorbing plate is configured to be attached on a plane.

11. The test system for LEDs of claim 1, further comprising a switch module, wherein the switch module comprises a plurality of switches, and each of the plurality of switches is connected to each of the LEDs to switch on power the LEDs;

the microcontroller reads light intensities of the LEDs when each of the plurality of switches is switched on.

16. The test system for LEDs of claim 11, wherein each of the plurality of light sensors is connected to the microcontroller by a signal line, each of the plurality of shielding members defines a first through hole, and the signal line extends through the first through hole.

18. The test system for LEDs of claim 16, wherein a diameter of each of the plurality of power lines is substantially equal to a diameter of the second through hole. Page 11 of 13

19. The test system for LEDs of claim 11, wherein each of the plurality of shielding members is substantially taper-shaped.

20. The test system for LEDs of claim 11, further comprising an absorbing plate on each of the plurality of shielding members, and the absorbing plate is configured to be attached on a plane.

12. A test system for light-emitting diodes LEDs comprising:

a microcontroller, the microcontroller comprising a time controlling module;

a plurality of light sensors, each of the plurality of light sensors being connected to controlling module and each of LEDs;

a plurality of shielding members, each of the plurality of shielding members being configured to receive each the plurality of light sensors and each of the LEDs connected to each of the plurality of light sensors; and

a display module;

wherein each of the plurality of light sensors is capable of detecting luminance of each of the LEDs;

each of the plurality of shielding members is configured to preventing light outside each of the shielding members interfering light emitted from each of the LEDs inside of each of the plurality of shielding members;

the microcontroller is adapted to read light intensities sensed by the plurality of light sensors according to a predetermined sequence and send the light intensities to the display module to display the light intensities in the predetermined sequence.

13. The test system for LEDs of claim 12, wherein the microcontroller further comprises an analog to digital (AD) transferring module connected to the time controlling module, and the AD transferring module transfers analogue light intensities outputted by the plurality of light sensor to digital light intensities according to the predetermined sequence.

14. The test system for LEDs of claim 13, wherein the microcontroller further comprises a storage module connected to the AD transferring module, and the storage module saves each of the digital light intensities outputted by the AD transferring module to an address.

15. The test system for LEDs of claim 13, wherein the microcontroller comprises a processing unit (CPU) connected to the storage module, the CPU reads a digital light intensity according to the corresponding address and display the digital light intensity and the LED.

17. The test system for LEDs of claim 15, further comprising a plurality of power wires, wherein each of the plurality of power wires is connected to each of the LEDs, each of the plurality of shielding members further defines a second through hole, and each of the plurality of power wires extends through the second through hole.