TRANSPARENT CONDUCTING LAYER FOR SOLAR CELL APPLICATIONS
First Claim
Patent Images
1. A method comprising:
- forming a bottom metallic electrode;
forming a semiconductor junction on the metallic electrode;
forming a transparent conducting overlayer in contact with the semiconductor junction; and
forming a metallic layer in contact with the transparent conducting overlayer, wherein the metallic layer is formed by a plating process.
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Abstract
Disclosed is a method which includes forming a bottom metallic electrode on an insulating substrate; forming a semiconductor junction on the metallic electrode; forming a transparent conducting overlayer in contact with the semiconductor junction; and forming a metallic layer in contact with the transparent conducting overlayer, wherein the metallic layer is formed by a plating process. The plating process may be an electroplating process or an electroless plating process. The transparent conducting overlayer may be carbon nanotubes or graphene. The semiconductor junction may be a p-i-n semiconductor junction, a p-n semiconductor junction, an n-p semiconductor junction or an n-i-p semiconductor junction.
11 Citations
25 Claims
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1. A method comprising:
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forming a bottom metallic electrode; forming a semiconductor junction on the metallic electrode; forming a transparent conducting overlayer in contact with the semiconductor junction; and forming a metallic layer in contact with the transparent conducting overlayer, wherein the metallic layer is formed by a plating process. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method comprising:
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forming a bottom metallic electrode; forming a semiconductor junction on the metallic electrode , the semiconductor junction being in direct contact with the bottom metallic electrode; forming a transparent conducting overlayer over and in direct contact with the semiconductor junction; and forming a metallic layer over and in direct contact with the transparent conducting overlayer, wherein the metallic layer is formed by a plating process. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17)
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18. A method comprising:
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forming a bottom metallic electrode; forming a semiconductor junction on the metallic electrode , the semiconductor junction being in direct contact with the bottom metallic electrode; forming a metallic layer over and in direct contact with the semiconductor junction, wherein the metallic layer is formed by a plating process; and forming a transparent conducting overlayer over and in direct contact with the metallic layer. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25)
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Specification