OPTICAL INSPECTING SYSTEM

• US 20130169789A1
• Filed: 10/29/2012
• Published: 07/04/2013
• Est. Priority Date: 12/29/2011
• Status: Abandoned Application

• Current Assignee: Chroma ATE Incorporated
• Original Assignee: Che-Cheng Hu, Ming-Han Lee, Yi-Lung Weng
• Inventors: Lee, Ming-Han, Hu, Che-Cheng, Weng, Yi-Lung
• Application Number:
  US13/663,092
• Publication Number:
  US 20130169789A1
• Time in Patent Office: Days
• US Class Current: 348/87
• CPC Class Codes: G01N 2021/8816 by using multiple sources, e.g. LEDs
• CPC Class Codes: G01N 21/95 characterised by the material or shape of the object to be examined G01N21/89 - G01N21/91, G01N21/94 take precedence
• CPC Class Codes: H04N 2209/044 using sequential colour illumination

Abstract

An optical inspecting system for inspecting a surface of a solar cell chip includes a housing, a control device, an image capturing device and a lighting device configured in the housing. The lighting device provides monochromatic lights on the solar cell chip, and the image capturing device captures the image of the solar cell chip. The control device is electrically connected to the image capturing device and the lighting device for controlling the optical inspecting system to perform defect and color inspecting processes on the surface of the solar cell chip. By the communication among the image capturing device, the lighting device, and the control device, images with different resolutions can be obtained according to different inspecting processes, and monochrome sensor array can be used for decreasing error.

Claims

1. An optical inspecting system, for performing a defect inspection and a color detection for a solar cell chip, comprising:

a housing, for disposing the solar cell chip;

an image capturing device, configured in the housing, for capturing the image of the solar cell chip according to a pulse signal;

a lighting device, configured in the housing, for providing a light beam according to a triggering signal and stopping providing the light beam according to an end signal; and

a control device, electrically connected to the image capturing device and the lighting device, for controlling the optical inspecting system to perform the defect inspection and the color detection on the solar cell chip;

wherein when the defect inspection is performed, the lighting device provides a first light beam and the image capturing device captures the image of the solar cell chip with a first pixel combination; and

when the color detection is performed, the lighting device provides a second light beam and the image capturing device captures the image of the solar cell chip with a second pixel combination.

2. The optical inspecting system of claim 1, wherein the image capturing device is a monochrome sensor array.

3. The optical inspecting system of claim 2, wherein the monochrome sensor array comprises one of a monochrome charge-coupled device and a complementary metal-oxide-semiconductor.

4. The optical inspecting system of claim 1, wherein the lighting device comprises a red light-emitting element, a green light-emitting element, and a blue light-emitting element.

5. The optical inspecting system of claim 4, wherein the first light beam is provided from the red light-emitting element;

and the second light beam is provided from one of the red light-emitting element, the green light-emitting element, and the blue light-emitting element.

6. The optical inspecting system of claim 1, wherein the image capturing device receives the pulse signal from the control device;

and the lighting device receives the triggering signal and the end signal from the control device.

7. The optical inspecting system of claim of claim 1, wherein when the color detection is performed, the lighting device receives the triggering signal and the end signal from the image capturing device, and the image capturing device receives the pulse signal from the lighting device.

8. The optical inspecting system of claim 1, wherein the housing comprises an image capturing containing part and a light box containing part;

the image capturing device is configured within the image capturing containing part and the lighting device is configured within the light box containing part;

the internal surfaces of the image capturing containing part and the light box containing part have been treated with black matte and white frosted surface treatments respectively.

9. The optical inspecting system of claim 8, wherein the lighting device provides light beam onto the internal surface of the light box containing part, and the light beam is scattered to the solar cell chip by the internal surface of the light box containing part.

10. The optical inspecting system of claim 1, wherein the first pixel combination further comprises a plurality of original pixel data, and the second pixel combination comprises a plurality of composite pixel data processed by binning.