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METHODS FOR TESTING WIRELESS ELECTRONIC DEVICES USING SHORT MESSAGE SERVICE

  • US 20130178203A1
  • Filed: 01/09/2012
  • Published: 07/11/2013
  • Est. Priority Date: 01/09/2012
  • Status: Active Grant
First Claim
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1. A method for using a test station to test a device under test having wireless communications circuitry, wherein the wireless communications circuitry includes antenna circuitry, and wherein the test station includes a test unit, the method comprising:

  • with the test unit, sending a first text message that places the wireless communications circuitry in a first operating mode;

    with the test unit, sending a second text message that places the wireless communications circuitry in a second operating mode that is different than the first operating mode, wherein the first and second text messages are sent using Short Message Service, wherein placing the wireless communications circuitry in the first operating mode comprises configuring the wireless communications circuitry to communicate using a first wireless network technology and to switch into use a first portion of the antenna circuitry, and wherein placing the wireless communications circuitry in the second operating mode comprises configuring the wireless communications circuitry to communicate using a second wireless network technology that is different than the first wireless network technology and to switch into use a second portion of the antenna circuitry that is different than the first portion;

    while the test unit is communicating with the device under test using the first wireless network technology, gathering first radio-frequency test measurements from the device under test using the test unit;

    while the test unit is communicating with the device under test using the second wireless network technology, gathering second radio-frequency test measurements from the device under test using the test unit; and

    determining whether the device under test satisfies design criteria by analyzing the first and second radio-frequency test measurements.

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