ULTRASONIC MODELING FOR INSPECTION OF COMPOSITE IRREGULARITIES

• US 20130188858A1
• Filed: 01/20/2012
• Published: 07/25/2013
• Est. Priority Date: 01/20/2012
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Bossi, Richard H., Lin, John Z., Tat, Hong
• Granted Patent: US 8,965,100 B2
• Time in Patent Office: Days
• US Class Current: 382/141
• CPC Class Codes: G01N 2291/0231 Composite or layered materials
• CPC Class Codes: G01N 2291/2694 Wings or other aircraft parts
• CPC Class Codes: G01N 29/043 in the interior, e.g. by shear waves
• CPC Class Codes: G01N 29/0654 Imaging
• CPC Class Codes: G01N 29/4427 with stored values, e.g. threshold values
• CPC Class Codes: G01N 29/4454 Signal recognition, e.g. specific values or portions, signal events, signatures
• CPC Class Codes: G01N 29/4472 Mathematical theories or simulation

Abstract

A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity parameter. The first simulated inspection is conducted using a first evaluation setting. A first image is produced based on the first waveform set, and it is determined whether a quality of the first image satisfies a predetermined threshold.

Claims

1. A method for use in inspecting a composite structure, said method comprising:

defining at least one irregularity parameter;

conducting a first simulated inspection to provide a first waveform data set associated with the at least one irregularity parameter, wherein the first simulated inspection is conducted using a first evaluation setting;

producing a first image based on the first waveform set; and

determining whether a quality of the first image satisfies a predetermined threshold.

2. A method in accordance with claim 1 further comprising identifying the first evaluation setting as a desired evaluation setting for use in inspecting the composite structure.

3. A method in accordance with claim 1 further comprising:

conducting a second simulated inspection to provide a second waveform data set associated with the at least one irregularity parameter, wherein the second simulated inspection is conducted using a second evaluation setting that is different from the first evaluation setting, wherein the quality of the first image does not satisfy the predetermined threshold;

producing a second image based on the second waveform set;

determining that a quality of the second image satisfies a predetermined threshold; and

identifying the second evaluation setting as a desired evaluation setting for use in inspecting the composite structure.

4. A method in accordance with claim 1 further comprising generating at least one model based on the at least one irregularity parameter, wherein the model is a graphical representation of the at least one irregularity parameter.

5. A method in accordance with claim 1, wherein defining at least one irregularity parameter further comprises defining at least one irregularity parameter including at least one of an irregularity thickness, an irregularity width, an irregularity length, an irregularity location, and an irregularity shape.

6. A method in accordance with claim 1 further comprising defining at least one composite structure parameter including at least one of an outer ply thickness, an inner ply thickness, a number of plies, a ply layup, a composite structure thickness, a material used to fabricate at least a portion of the at least one composite structure, a number of element layers per ply, a resin thickness, and a resin density.

7. A method in accordance with claim 1 further comprising defining at least one stimulation parameter including at least one of a type of stimulating mechanism, a beam width, a wave mode, a relative orientation of at least one stimulating mechanism with respect to the composite structure, a distance between the at least one stimulating mechanism and the composite structure, a distance between the at least one stimulating mechanism and a sensor, an impulse shape and center frequency, a couplant, and a couplant thickness.

8. A computer-readable storage device having encoded thereon computer readable instructions that are executable by a processor to perform functions comprising:

conducting a first simulated inspection to provide a first waveform data set associated with at least one irregularity parameter, wherein the first simulated inspection is conducted using a first evaluation setting;

producing a first image based on the first waveform set; and

determining whether a quality of the first image satisfies a predetermined threshold.

9. A computer-readable storage device in accordance with claim 8, wherein the functions performed by the processor further comprise identifying the first evaluation setting as a desired evaluation setting for use in inspecting the composite structure.

10. A computer-readable storage device in accordance with claim 8, wherein the functions performed by the processor further comprise:

conducting a second simulated inspection to provide a second waveform data set associated with the at least one irregularity parameter, wherein the second simulated inspection is conducted using a second evaluation setting that is different from the first evaluation setting, wherein the quality of the first image does not satisfy the predetermined threshold;

producing a second image based on the second waveform set;

determining that a quality of the second image satisfies a predetermined threshold; and

identifying the second evaluation setting as a desired evaluation setting for use in inspecting the composite structure.

11. A computer-readable storage device in accordance with claim 8, wherein the functions performed by the processor further comprise generating at least one model based on the at least one irregularity parameter, wherein the model is a graphical representation of the at least one irregularity parameter.

12. A computer-readable storage device in accordance with claim 8, wherein the functions performed by the processor further comprise defining at least one irregularity parameter including at least one of an irregularity thickness, an irregularity width, an irregularity length, an irregularity location, and an irregularity shape.

13. A computer-readable storage device in accordance with claim 8, wherein the functions performed by the processor further comprise defining at least one composite structure parameter including at least one of an outer ply thickness, an inner ply thickness, a number of plies, a ply layup, a composite structure thickness, a material used to fabricate at least a portion of the at least one composite structure, a number of element layers per ply, a resin thickness, and a resin density.

14. A computer-readable storage device in accordance with claim 8, wherein the functions performed by the processor further comprise defining at least one stimulation parameter including at least one of a type of stimulating mechanism, a beam width, a wave mode, a relative orientation of at least one stimulating mechanism with respect to the composite structure, a distance between the at least one stimulating mechanism and the composite structure, a distance between the at least one stimulating mechanism and a sensor, an impulse shape and center frequency, a couplant, and a couplant thickness.

15. A system comprising:

a modeling module configured to conduct a first simulated inspection to provide a first waveform data set associated with at least one irregularity parameter, wherein the first simulated inspection is conducted using a first evaluation setting; and

an imaging module configured to produce a first image based on the first waveform set, and determine whether a quality of the first image satisfies a predetermined threshold.

16. A system in accordance with claim 15 further comprising an evaluating module configured to identify the first evaluation setting as a desired evaluation setting for use in inspecting the composite structure.

17. A system in accordance with claim 15, wherein the modeling module is further configured to conduct a second simulated inspection to provide a second waveform data set associated with the at least one irregularity parameter, the imaging module is further configured to produce a second image based on the second waveform set, and determine that a quality of the second image satisfies a predetermined threshold, and the system further comprises an evaluating module configured to identify a second evaluation setting as a desired evaluation setting for use in inspecting the composite structure, wherein the second simulated inspection is conducted using the second evaluation setting that is different from the first evaluation setting, wherein the quality of the first image does not satisfy the predetermined threshold.

18. A system in accordance with claim 15, wherein the modeling module is further configured to generate at least one model based on the at least one irregularity parameter, wherein the model is a graphical representation of the at least one irregularity parameter.

19. A system in accordance with claim 15, wherein the modeling module is further configured to define at least one irregularity parameter including at least one of an irregularity thickness, an irregularity width, an irregularity length, an irregularity location, and an irregularity shape, and define at least one composite structure parameter including at least one of an outer ply thickness, an inner ply thickness, a number of plies, a ply layup, a composite structure thickness, a material used to fabricate at least a portion of the at least one composite structure, a number of element layers per ply, a resin thickness, and a resin density.

20. A system in accordance with claim 15, wherein the modeling module is further configured to define at least one stimulation parameter including at least one of a type of stimulating mechanism, a beam width, a wave mode, a relative orientation of at least one stimulating mechanism with respect to the composite structure, a distance between the at least one stimulating mechanism and the composite structure, a distance between the at least one stimulating mechanism and a sensor, an impulse shape and center frequency, a couplant, and a couplant thickness.