Testing System with Mobile Storage Carts and Computer-Controlled Loading Equipment

• US 20130200916A1
• Filed: 05/17/2012
• Published: 08/08/2013
• Est. Priority Date: 02/06/2012
• Status: Abandoned Application

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Panagas, Peter G.
• Application Number:
  US13/474,262
• Publication Number:
  US 20130200916A1
• Time in Patent Office: Days
• US Class Current: 324/757.01
• CPC Class Codes: G01R 1/0441 Details
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2893 Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67
• CPC Class Codes: G06F 2203/04103 Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
• CPC Class Codes: G06F 3/044 by capacitive means
• CPC Class Codes: H01L 21/67727 using a general scheme of a conveying path within a factory
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
• CPC Class Codes: H04M 1/24 Arrangements for testing

Abstract

A test system may be provided in which devices under test undergo various types of testing. A first test location may have test equipment for testing input/output devices in the devices under test. A second test location may have test equipment for testing wireless communications circuitry in the devices under test. A mobile storage cart having shelves may be used to store the devices under test and to convey the devices under test between test locations. The storage cart may be configured to engage with a stationary frame structure at a test location. Actuators underneath the storage cart may be used to position the storage cart in a desired location. Distance sensors may be used to obtain status information about each shelf in the storage cart. A computer-controlled loading structure may be used to load the devices under test from the storage cart into test enclosures.

Claims

1. A test system for testing a plurality of devices under test, comprising:

a device under test storage cart configured to store the plurality of devices under test;

a test station for testing the plurality of devices under test; and

a computer-controlled loading structure configured to move a device under test in the plurality of devices under test from the device under test storage cart to the test station.

2. The test system defined in claim 1 wherein the device under test storage cart comprises a plurality of shelves and wherein each shelf in the plurality of shelves is configured to store an associated device under test in the plurality of devices under test.

3. The test system defined in claim 1 wherein the computer-controlled loading structure comprises at least one robotic arm configured to move along three different axes.

4. The test system defined in claim 3 wherein the at least one robotic arm comprises pneumatic structures that are configured to temporarily adhere the device under test to the robotic arm.

5. The test system defined in claim 1, further comprising:

at least one sensor configured to scan and to obtain status information from the device under test storage cart, wherein the computer-controlled loading structure is further configured to unload the device under test storage cart based on the obtained status information.

6. The test system defined in claim 5 wherein the at least one sensor comprises at least one distance sensor.

7. The test system defined in claim 5 wherein the status information comprises information about the orientation of each of the devices under test in the device under test storage cart.

8. The test system defined in claim 1 wherein the computer-controlled loading structure is coupled to a stationary frame structure and is configured to move with respect to the stationary frame structure, wherein the stationary frame structure comprises registration structures, and wherein the device under test storage cart comprises alignment features configured to align and mate with the registration structures.

9. A method of using a test system to test a plurality of devices under test, wherein the test system includes a device under test storage cart, a test enclosure, and a computer-controlled loader coupled to a stationary frame structure, the method comprising:

loading the plurality of devices under test into the device under test storage cart;

engaging the device under test storage cart with the stationary frame structure;

with at least one sensor, obtaining status information about the plurality of devices under test in the device under test storage cart; and

in response to obtaining the status information and while the device under test storage cart is engaged with the stationary frame structure, loading at least some of the plurality of devices under test from the device under test storage cart into the test enclosure with the computer-controlled loader.

10. The method defined in claim 9 wherein engaging the device under test storage cart with the stationary frame structure at the test area comprises aligning alignment features on the device under test storage cart with corresponding registration structures on the stationary frame structure.

11. The method defined in claim 9 wherein the at least one sensor comprises at least one laser and wherein obtaining status information about the devices under test comprises using the at least one laser to determine surface characteristics of the devices under test.

12. The method defined in claim 9 wherein the device under test storage cart comprises a plurality of shelves and wherein obtaining status information about the devices under test comprises using the at least one sensor to determine whether or not a device is present on a shelf in the plurality of shelves.

13. The method defined in claim 9 wherein the device under test storage cart comprise a plurality of shelves and wherein obtaining status information about the devices under test comprises using the at least one sensor to determine whether or not a device is oriented properly on a shelf in the plurality of the shelves.

14. The method defined in claim 9 wherein the computer-controlled loader comprises first and second robotic arms and wherein loading at least some of the devices under test from the device under test storage cart into the test enclosure comprises:

with the first robotic arm, picking up a first device under test in the plurality of devices under test from the device under test storage cart;

with the first robotic arm, placing the first device under test into a test enclosure;

with a second robotic arm, picking up a second device under test in the plurality of devices under test from the device under test storage cart;

while holding the second device under test with the second robotic arm, removing the first device under test from the test enclosure with the first robotic arm; and

while holding the first device under test with the first robotic arm, placing the second device under test into the test enclosure.

15. A method of testing a plurality of devices under test, comprising:

testing the plurality of devices under test using a first set of test stations;

following testing of the plurality of devices under test with the first set of test stations, loading the plurality of devices under test into a device under test storage cart;

moving the device under test storage cart to a new location; and

with at least one computer-controlled robotic arm, loading a device under test in the plurality of devices under test from the device under test storage cart into a test enclosure at the new location.

16. The method defined in claim 15, wherein the test enclosure comprises an electromagnetically shielded test enclosure and wherein loading the device under test into the test enclosure comprises loading the device under test into the electromagnetically shielded test enclosure.

17. The method defined in claim 15 wherein the storage cart comprises a plurality of shelves, the method further comprising:

after moving the device under test storage cart to the new location, using at least one sensor to assign a status to each shelf in the plurality of shelves in the device under test storage cart.

18. The method defined in claim 15, further comprising:

using the at least one computer-controlled robotic arm, unloading the device under test from the test enclosure; and

returning the device under test to the device under test storage cart.

19. The method defined in claim 15, further comprising:

using the at least one computer-controlled robotic arm, unloading the device under test from the test enclosure; and

loading the device under test into another device under test storage cart.

20. The method defined in claim 15, further comprising:

in response to loading the device under test from the device under test storage cart into the test enclosure, testing wireless communications circuitry in the device under test.