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METHODS AND APPARATUS FOR MEASURING ANALYTES

  • US 20130210182A1
  • Filed: 03/12/2013
  • Published: 08/15/2013
  • Est. Priority Date: 10/22/2008
  • Status: Abandoned Application
First Claim
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1. A method for manufacturing a sensor device, the method comprising:

  • depositing a structure over an array of sensors, a sensor of the array of sensors including an electrode structure;

    defining an array of reaction chambers in the structure, a reaction chamber of the array of reaction chambers having a sidewall surface and having a lower surface overlying the electrode structure; and

    applying a buffering inhibitor on at least one of the sidewall surface or the lower surface of the reaction chamber.

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  • 6 Assignments
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