METHODS AND APPARATUS FOR MEASURING ANALYTES
First Claim
Patent Images
1. A method for manufacturing a sensor device, the method comprising:
- depositing a structure over an array of sensors, a sensor of the array of sensors including an electrode structure;
defining an array of reaction chambers in the structure, a reaction chamber of the array of reaction chambers having a sidewall surface and having a lower surface overlying the electrode structure; and
applying a buffering inhibitor on at least one of the sidewall surface or the lower surface of the reaction chamber.
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Abstract
Methods and apparatus relating to FET arrays for monitoring chemical and/or biological reactions such as nucleic acid sequencing-by-synthesis reactions. Some methods provided herein relate to improving signal (and also signal to noise ratio) from released hydrogen ions during nucleic acid sequencing reactions.
67 Citations
20 Claims
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1. A method for manufacturing a sensor device, the method comprising:
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depositing a structure over an array of sensors, a sensor of the array of sensors including an electrode structure; defining an array of reaction chambers in the structure, a reaction chamber of the array of reaction chambers having a sidewall surface and having a lower surface overlying the electrode structure; and applying a buffering inhibitor on at least one of the sidewall surface or the lower surface of the reaction chamber. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for manufacturing a sensor device, the method comprising:
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depositing a structure over an array of sensors, a sensor of the array of sensors including an electrode structure having an upper surface; defining an array of reaction chambers in the structure, a reaction chamber of the array of reaction chambers having a sidewall surface and having a lower surface defined by the upper surface of the electrode structure; and applying a buffering inhibitor to the upper surface of the electrode structure. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification