LIGHT EMITTING DIODE AND FABRICATION METHOD THEREOF

• US 20130214245A1
• Filed: 12/30/2010
• Published: 08/22/2013
• Est. Priority Date: 11/03/2010
• Status: Abandoned Application

• Current Assignee: Enraytek Optoelectronics Co., Ltd
• Original Assignee: Enraytek Optoelectronics Co., Ltd
• Inventors: Chang, Richard Rugin, Xiao, Deyuan
• Application Number:
  US13/059,631
• Publication Number:
  US 20130214245A1
• Time in Patent Office: Days
• US Class Current: 257/13
• CPC Class Codes: H01L 2933/0091 Scattering means in or on the semiconductor body or semiconductor body package H01L33/22 takes precedence
• CPC Class Codes: H01L 33/06 within the light emitting region, e.g. quantum confinement structure or tunnel barrier
• CPC Class Codes: H01L 33/20 with a particular shape, e.g. curved or truncated substrate
• CPC Class Codes: H01L 33/58 Optical field-shaping elements

Abstract

The present invention discloses an LED and its fabrication method. The LED comprises: a substrate; an epitaxial layer, an active layer and a capping layer arranged on the substrate in sequence; wherein a plurality of microlens structures arc formed on the surface of the substrate away from the epitaxial layer, and a plurality of cams are formed on the surfaces of the microlens structures. When the light emitted from the active layer passes through the surfaces of the microlens structures or the surfaces of the cams, the incident angle is always smaller than the critical angle of total reflection, thus preventing total reflection and making sure that most of the light pass through the surfaces of the microlens structures and the cams, in this way improving external quantum efficiency of the LED, avoiding the rise of the internal temperature of the LED and improving the performance of the LED.

Claims

1. A light emitting diode, comprising:

a substrate;

an epitaxial layer, an active layer and a capping layer arranged on the substrate in sequence;

wherein, a plurality of microlens structures are formed on the surface of the substrate away from the epitaxial layer, and a plurality of cams are formed on the surfaces of the microlens structures and on the surface of the substrate away from the epitaxial layer.

2. The light emitting diode as claimed in claim 1, characterized in that, the substrate is a sapphire substrate, a silicon carbide substrate or a gallium nitride substrate.

3. The light emitting diode as claimed in claim 1, characterized in that, the light emitting diode further comprises a buffer layer between the substrate and the epitaxial layer, the material of the buffer layer being gallium nitride.

4. The light emitting diode as claimed in claim 1, characterized in that, the light emitting diode further comprises a transparent conductive layer on the capping layer.

5. The light emitting diode as claimed in claim 4, characterized in that, the light emitting diode further comprises a first electrode, a second electrode, and an opening passing through the transparent conductive layer, the capping layer and the active layer, wherein,

the first electrode is on the transparent conductive layer to connect the transparent conductive layer to the positive terminal of a power;

the second electrode is in the opening to connect the epitaxial layer to the negative terminal of the power.

6. The light emitting diode as claimed in claim 5, characterized in that, the light emitting diode further comprises a passivation layer on the transparent conductive layer, the passivation layer covering the first electrode and the second electrode.

7. The light emitting diode as claimed in claim 1, characterized in that, the material of the epitaxial layer is N-doped gallium nitride;

the active layer comprises a multiple-quantum-well active layer, the material of the multiple-quantum-well active layer being indium-gallium nitride;

the material of the capping layer is P-doped gallium nitride.

8. A fabrication method of the light emitting diode as claimed in claim 1, characterized in that, comprising:

providing a substrate;

forming an epitaxial layer, an active layer and a capping layer on the substrate in sequence;

forming a plurality of microlens structures on the surface of the substrate away from the epitaxial layer, and forming a plurality of cams on the surfaces of microlens structures and on the surface of the substrate away from the epitaxial layer.

9. The fabrication method as claimed in claim 8, characterized in that, the step of forming a plurality of microlens structures and a plurality of cams comprises:

forming a plurality of cylindrical photoresist blocks on the surface of the substrate away from the epitaxial layer;

baking the cylindrical photoresist blocks to turn the cylindrical photoresist blocks into spherical-crown photoresists;

performing a first inductive coupled plasma etch process until the spherical-crown photoresists are completely etched so as to form a plurality of microlens structures on the surface of the substrate away from the epitaxial layer;

forming a plurality of Al₂O particles on the surface of the substrate away from the epitaxial layer and on the surfaces of the microlens structures;

performing a second inductive coupled plasma etch process until the Al₂O₅ particles are completely etched so as to form a plurality of cams on the surface of the substrate away from the epitaxial layer and on the surfaces of the microlens structures.

10. The fabrication method as claimed in claim 9, characterized in that, in the first inductive coupled plasma etch process, the etching gas is a mixture of boron trichloride, helium gas and argon gas, the cavity pressure being 50 mTorr˜

2 Torr, the plate power being 200 W˜

300 W, the coil power being 300 W˜

500 W.

11. The fabrication method as claimed in claim 9, characterized in that, in the second inductive coupled plasma etch process, the etching gas is a mixture of boron trichloride, helium gas and argon gas, the cavity pressure being 50 mTorr˜

2 Torr, the plate power being 200 W˜

300 W, the coil power being 300 W˜

500 W.

12. The fabrication method as claimed in claim 9, characterized in that, the cylindrical photoresist blocks are baked under a temperature of 120°

C.˜

250°

C. to turn the cylindrical photoresist blocks into spherical-crown photoresists.

13. The fabrication method as claimed in claim 8, characterized in that, the material of the epitaxial layer is N-doped gallium nitride;

the active layer comprises a multiple-quantum-well active layer, the material of the multiple-quantum-well active layer being indium-gallium nitride;

the material of the capping layer is P-doped gallium nitride.

14. The fabrication method as claimed in claim 8, further comprising growing a gallium nitride film on the substrate to form a buffer layer before the formation of the epitaxial layer.

15. The fabrication method as claimed in claim 8, further comprising forming a transparent conductive layer on the capping layer after the formation of the capping layer.

16. The fabrication method as claimed in claim 15, characterized in that, after the formation of the transparent conductive layer, further comprises:

forming a first electrode on the transparent conductive layer;

forming an opening passing through the transparent conductive layer, the capping layer and the active layer;

forming a second electrode in the opening.

17. The fabrication method as claimed in claim 16, characterized in that, after forming the second electrode in the opening, further comprises:

forming a passivation layer on the transparent conductive layer, the passivation layer covering the first electrode and the second electrode.

18. The fabrication method as claimed in claim 8, further comprising reducing the thickness of the substrate before the formation of a plurality of microlens structures on the surface of the substrate away from the epitaxial layer.