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Use of Capacitance And Eddy Currents to Analyze Polycrystalline Diamond

  • US 20130214769A1
  • Filed: 02/21/2012
  • Published: 08/22/2013
  • Est. Priority Date: 02/21/2012
  • Status: Abandoned Application
First Claim
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1. A method of characterizing a quality of a polycrystalline structure, comprising:

  • obtaining a leached component comprising a polycrystalline structure, the polycrystalline structure comprising a leached layer and an unleached layer positioned adjacent to the leached layer, the leached layer having at least a portion of a catalyst material removed from therein;

    measuring at least one measured capacitance value of the leached component;

    measuring at least one measured eddy current value of the leached component;

    characterizing a first quality of the polycrystalline structure, the first quality being based upon the at least one measured capacitance value;

    characterizing a second quality of the polycrystalline structure, the second quality being based upon the at least one measured eddy current value; and

    determining an overall quality of the polycrystalline structure, the overall quality being based upon the first quality and the second quality.

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