ELECTRICAL TEST DEVICE AND METHOD
First Claim
1. An electrical test device adapted to apply current to an electrical system during measurement of a plurality of parameters, comprising:
- a power supply connected to an external power source;
a conductive probe element configured to be energized by the power supply, the probe element being configured to be placed in contact with an electrical system and apply to the electrical system an input signal containing current for measuring at least one parameter of the electrical system;
a spectral analysis block connected to the probe element and being configured to perform the following;
receive an output signal from the electrical system in response to application of the input signal;
analyze a frequency spectra of the output signal, the frequency spectra having a low-frequency portion and a high-frequency portion and containing energy contributed by the periodic and non-periodic signals,analyze the low-frequency portion and detect the potential occurrence of arcing in the electrical system when the energy contributed by the non-periodic signals in the low-frequency portion exceeds a predetermined energy threshold,analyze the high-frequency portion when the energy in the low-frequency portion exceeds the energy threshold and detect the occurrence of arcing in the electrical system when the energy in the high-frequency portion exceeds the energy threshold.
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Accused Products
Abstract
An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The conductive probe element may be energized by a power supply. The probe element may be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system.
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Citations
20 Claims
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1. An electrical test device adapted to apply current to an electrical system during measurement of a plurality of parameters, comprising:
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a power supply connected to an external power source; a conductive probe element configured to be energized by the power supply, the probe element being configured to be placed in contact with an electrical system and apply to the electrical system an input signal containing current for measuring at least one parameter of the electrical system; a spectral analysis block connected to the probe element and being configured to perform the following; receive an output signal from the electrical system in response to application of the input signal; analyze a frequency spectra of the output signal, the frequency spectra having a low-frequency portion and a high-frequency portion and containing energy contributed by the periodic and non-periodic signals, analyze the low-frequency portion and detect the potential occurrence of arcing in the electrical system when the energy contributed by the non-periodic signals in the low-frequency portion exceeds a predetermined energy threshold, analyze the high-frequency portion when the energy in the low-frequency portion exceeds the energy threshold and detect the occurrence of arcing in the electrical system when the energy in the high-frequency portion exceeds the energy threshold. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of detecting arcing in an electrical system, comprising the steps of:
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placing a conductive probe element in contact with an electrical system; providing power to the conductive probe element from an external power source; applying an input signal to the electrical system, the input signal containing current; receiving an output signal from the electrical system in response to the application of the input signal to the electrical system; analyzing a frequency spectra of the output signal, the frequency spectra having a low-frequency portion and a high-frequency portion and containing energy contributed by the periodic and non-periodic signals; analyzing the low-frequency portion and detecting the potential occurrence of arcing in the electrical system when the energy contributed by the non-periodic signals in the low-frequency portion exceeds a predetermined energy threshold; and analyzing the high-frequency portion when the energy in the low-frequency portion exceeds the energy threshold and detect the occurrence of arcing in the electrical system when the energy in the high-frequency portion exceeds the energy threshold. - View Dependent Claims (8, 9, 10)
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11. An electrical test device, comprising:
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a power supply connected to an external power source; a conductive probe element configured to be placed in contact with an electrical path of an electrical system and energized by the power supply for applying to the electrical path an input signal of relatively low-amperage; and a processor connected to the probe element and being configured to receive an output signal from the electrical path and determine a first voltage across the electrical path in response to the low-amperage input signal; the processor being configured to apply a relatively high-amperage current pulse to the electrical path and determine a second voltage across the electrical path in response to application of the high-amperage current pulse; the processor being configured to determine a voltage drop across the electrical path based on the difference between the first voltage and the second voltage. - View Dependent Claims (12, 13, 14, 15)
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16. A method of measuring a voltage drop in a relatively low-impedance electrical path, comprising the steps of:
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placing a conductive probe element in contact with the electrical path; energizing the probe element from an power supply; applying, using the probe element, a relatively low-amperage input signal to the electrical path using the probe element; determining, using the processor, a first voltage across the electrical path in response to the application of the low-amperage input signal; applying, using the probe element, a relatively high-amperage current pulse to the electrical path; determining, using the processor, a second voltage across the electrical path in response to the application of the high-amperage current pulse; and determining, using the processor, a voltage drop across the electrical path based on the difference between the first voltage and the second voltage. - View Dependent Claims (17, 18, 19, 20)
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Specification