INTERFEROMETER AND FOURIER-TRANSFORM SPECTROSCOPIC ANALYZER

• US 20130222790A1
• Filed: 09/06/2011
• Published: 08/29/2013
• Est. Priority Date: 10/28/2010
• Status: Active Grant

• Current Assignee: FOSS Analytical A/S
• Original Assignee: Konica Minolta Inc.
• Inventors: Hirao, Yusuke
• Granted Patent: US 9,109,869 B2
• Time in Patent Office: Days
• US Class Current: 356/51
• CPC Class Codes: G01B 9/02061 Reduction or prevention of effects of tilts or misalignment
• CPC Class Codes: G01J 3/4535 Devices with moving mirror G01J3/4532 takes precedence

Abstract

An interferometer (1) measures a measuring interference beam, while detecting the position of a moving mirror (16) on the basis of detection results obtained from a reference beam detector (25). In the interferometer, a reference beam source (21) is configured by including a light source (21a) composed of a semiconductor laser device. A reference optical system (20) has a collimating optical system (22) for a reference beam, said collimating optical system converting a laser beam outputted from the reference beam source (21) into a collimated beam, and the collimated beam is diagonally inputted to a fixed mirror (15).

Claims

1. An interferometer, comprising:

a measurement optical system in which measurement light is split by a beam splitter into light beams, which are guided to a movable mirror and to a stationary mirror, respectively, and the light beam reflected off the movable mirror and the light beam reflected off the stationary mirror are combined by the beam splitter into measurement interference light, which is guided to a measurement light photodetector; and

a reference optical system in which reference light from a reference light source is split by the beam splitter into light beams, which are guided to the movable mirror and to the stationary mirror, respectively, and the light beam reflected off the movable mirror and the light beam reflected off the stationary mirror are combined by the beam splitter into reference interference light, which is guided to a reference light photodetector,

the interferometer performing measurement of the measurement interference light while, based on a detection result of the reference light photodetector, detecting a position of the movable mirror,

wherein

the reference light source is constituted by a semiconductor laser or a laser light source that outputs laser light emitted from the semiconductor laser via a waveguide or a fiber,

the reference optical system has a collimator optical system for reference light that converts laser light emitted from the reference light source into collimated light, and

the collimated light becomes obliquely incident on the stationary mirror.

2. The interferometer according to claim 1, further comprising:

a correction unit that, based on a detection result of the reference light photodetector, detects an error in relative inclination between reflected light reflected off the movable mirror and reflected light reflected off the stationary mirror and corrects the error by inclining the movable mirror or the stationary mirror,

wherein an angle of incidence of the collimated light on the stationary mirror is larger than a maximum value of an inclination angle by which the movable mirror or the stationary mirror can be inclined by the correction unit.

3. The interferometer according to claim 2, wherein

the correction unit corrects an error in relative inclination between reflected light reflected off the movable mirror and reflected light reflected off the stationary mirror by inclining the movable mirror, and

an angle formed by an optical axis of the reference light and an optical axis of the measurement light is larger than a maximum value of an inclination angle by which the movable mirror can be inclined by the correction unit.

4. The interferometer according to claim 2, wherein

the correction unit corrects an error in relative inclination between reflected light reflected off the movable mirror and reflected light reflected off the stationary mirror by inclining the stationary mirror, and

an angle formed by an optical axis of the reference light and an optical axis of the measurement light is larger than a maximum value of an inclination angle by which the stationary mirror can be inclined by the correction unit.

5. The interferometer according to claim 1, wherein

an angle of incidence of the collimated light on the stationary mirror is not more than a maximum value of an inclination angle by which, within a light beam of the measurement light that becomes incident on the movable mirror when positioned at a most distant possible position from the beam splitter, the collimated light becoming incident on the movable mirror is inclined.

6. The interferometer according to claim 1, wherein

the measurement optical system has a collimator optical system for measurement light that converts the measurement light into collimated light, and

assuming that, when the movable mirror is at a most distant possible position from the beam splitter, a distance from the collimator optical system for measurement light to the position of the movable mirror is indicated as f, and a light beam size of light collimated at the collimator optical system for measurement light is indicated as e,

an angle of incidence of collimated light of the reference optical system on the stationary mirror is smaller than an angle corresponding to a ratio e/f.

7. The interferometer according to claim 2, wherein

the correction unit comprises:

a signal processing part that, based on a detection result of the reference light photodetector, detects an error in relative inclination between reflected light reflected off the movable mirror and reflected light reflected off the stationary mirror;

an optical path correction mechanism that corrects an optical path of light reflected off the movable mirror or the stationary mirror by inclining the movable mirror or the stationary mirror; and

a control part that, based on the error in inclination detected at the signal processing part, controls the optical path correction mechanism.

8. The interferometer according to claim 2, wherein

the reference light photodetector is constituted by a division sensor, and

based on an output from each of elements constituting the division sensor, the correction unit detects an error in relative inclination between reflected light of the measurement light reflected off the movable mirror and reflected light of the measurement light reflected off the stationary mirror.

9. The interferometer according to claim 2, wherein

the measurement optical system has a collimator optical system for measurement light that converts the measurement light into collimated light, and

a light beam size of reference light converted into collimated light by the collimator optical system for reference light is smaller than a light beam size of measurement light converted into collimated light by the collimator optical system for measurement light.

10. A Fourier-transform spectroscopic analyzer, comprising:

the interferometer according to claim 1; and

a computation part that performs sampling and a Fourier transform of an interferogram obtained as a result of the measurement light photodetector of the interferometer receiving the measurement interference light and thereby generates a spectrum of a wavelength contained in the measurement light.

11. The Fourier-transform spectroscopic analyzer according to claim 10, wherein

the interferometer further comprises a signal generation part that, based on a detection result of the reference light photodetector in the reference optical system, generates a signal representing timing for sampling the interferogram, and

based on, with respect to an interferogram of measurement interference light obtained in a case where light having a particular wavelength is used as the measurement light, a deviation from the particular wavelength of a wavelength obtained by performing sampling of the interferogram at timing based on a signal from the signal generation part, followed by a Fourier transform, the computation part corrects the timing for sampling.

12. The Fourier-transform spectroscopic analyzer according to claim 10, wherein

the measurement light is near infrared light or infrared light, and

the reference light is red light.