Diagnose System for Rearranging Order of Testing Items in Diagnose Program in Accordance with a Log File

• US 20130231895A1
• Filed: 02/13/2013
• Published: 09/05/2013
• Est. Priority Date: 03/01/2012
• Status: Active Grant

• Current Assignee: Inventec Appliances Company Limited (Inventec Corporation), Inventec Appliances Corporation (Inventec Corporation), Inventec Appliances (Pudong) Corp. (Inventec Corporation)
• Original Assignee: Inventec Appliances Corporation (Inventec Corporation), Inventec Appliances (Pudong) Corp. (Inventec Corporation)
• Inventors: ZHU, Jianjun
• Granted Patent: US 9,342,803 B2
• Time in Patent Office: Days
• US Class Current: 702/183
• CPC Class Codes: G06F 11/263 Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
• CPC Class Codes: G06Q 10/04 Forecasting or optimisation specially adapted for administrative or management purposes, e.g. linear programming or "cutting stock problem" market predictions or forecasting for commercial activities G06Q30/0202

Abstract

Disclosed is a diagnose system for rearranging order of testing items in a diagnose program and a method thereof. The method is applicable to a diagnose system, including an electronic device to be tested, a storage component and a plurality of detecting apparatuses. The electronic device to be tested includes an interface and stores a diagnose program including a plurality of testing items. The storage component is electrically coupled to the electronic device to be tested through the interface for reading a log file that includes a plurality of invocation commands, so that the electronic device to be tested can sequentially execute each of the invocation commands to invoke the corresponding testing items. Each of the detecting apparatuses corresponds to at least one testing item so as to drive each of the detecting apparatuses and execute a corresponding testing process to the electronic device to be tested.

Claims

1. A diagnose system for rearranging order of testing items in a diagnose program in accordance with a log file, comprising:

an electronic device to be tested, wherein the electronic device to be tested has an interface, the diagnose program including a plurality of testing items is stored in the electronic device to be tested, and each of the testing items respectively comprises a testing parameter;

a storage component, wherein the log file is stored in the storage component, the log file includes a plurality of invocation commands and each of the invocation commands corresponds to at least one of the testing items, the storage component is electrically coupled to the electronic device to be tested through the interface to enable the electronic device to be tested reading the log file via the interface and sequentially proceeding each of the invocation commands for making the electronic device to be tested invoke corresponding ones of the testing items while executing the invocation commands; and

a plurality of detecting apparatus, each of the detecting apparatus being corresponding to at least one of the testing items, wherein after the corresponding ones of the testing items are invoked by the electronic device to be tested, each of the detecting apparatus is driven to perform a corresponding testing process toward the electronic device to be tested in accordance with testing parameters corresponding to the testing items.

2. The diagnose system of claim 1, wherein the storage component comprises at least one parameter configuration file, each of the parameter configuration files respectively corresponds to one of the invocation commands and further corresponds to each of the testing items there through, each of the parameter configuration files comprises at least one parameter command, between the parameter configuration files and the corresponding ones of the testing items, each of the parameter commands corresponds to each of the testing parameters, and the electronic device to be tested sequentially reads each of the parameter commands through the interface and further modifies the corresponding ones of the testing parameters to enable each of the detecting apparatus performing a corresponding one of the testing processes toward the electronic device to be tested in accordance with each modified ones of the corresponding testing parameters.

3. The diagnose system of claim 1, wherein the storage component is a memory card.

4. The diagnose system of claim 1, wherein the storage component is a flash memory supporting hot plug-in.

5. A method for rearranging order of testing items in a diagnose program in accordance with a log file, applicable to a diagnose system comprising an electronic device to be tested, a storage component and a plurality of detecting apparatus, the method comprising:

proceeding the diagnose program which is stored in the electronic device to be tested, wherein a plurality of testing items are disposed within the diagnose program, and each of the testing item respectively comprises at least one testing parameter;

reading the log file stored inside the storage component through an interface of the electronic device to be tested, wherein the log file comprises a plurality of invocation commands, and each of the invocation commands corresponds to at least one of the testing items;

proceeding each of the invocation commands sequentially and invoking the corresponding ones of the testing items in accordance with the invocation commands; and

driving each of the detecting apparatus and respectively performing a corresponding testing process toward the electronic device to be tested in accordance with the testing parameters of each of the testing items which correspond to each of the invocation commands, and each of the detecting apparatus corresponds to at least one of the testing items.

6. The method of claim 5, wherein the storage component comprises at least one parameter configuration file, each of the parameter configuration files respectively corresponds to the invocation command and respectively through the corresponding ones of the invocation commands corresponding to each of the testing items, each of the parameter configuration files comprises at least one parameter command, between the parameter configuration files and the corresponding ones of the testing items, each of the parameter commands corresponds to each of the testing parameters, and the electronic device to be tested sequentially reads each of the testing parameters via the interface and further modifies the corresponding ones of the testing parameters to make each of the detecting apparatus perform the corresponding testing process in accordance with each modified ones of the corresponding testing parameters.