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NON-VOLATILE MEMORY DEVICE AND PRODUCTION METHOD THEREOF

  • US 20130234101A1
  • Filed: 11/22/2010
  • Published: 09/12/2013
  • Est. Priority Date: 11/22/2010
  • Status: Active Grant
First Claim
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1. A non-volatile storage device, comprising:

  • a first conductive layer formed on a semiconductor substrate;

    a first semiconductor layer formed on the first conductive layer;

    a first line formed on a sidewall of the first semiconductor layer through a first insulator film, and extended in a first direction along a main surface of the semiconductor substrate;

    a second semiconductor layer formed on the first semiconductor layer;

    a second line formed on a sidewall of the second semiconductor layer through a second insulator film, and extended in the first direction;

    a plurality of stacked films having a plurality of third insulator films and a plurality of third lines alternately stacked together, aligned in a second direction orthogonal to the first direction, and extended in the first direction;

    a first memory material layer and a third semiconductor layer stacked on one of facing sidewalls of the plurality of adjacent stacked films, and a second memory material layer and a fourth semiconductor layer stacked on the other of the facing sidewalls of the plurality of stacked films; and

    a plurality of second conductive layers formed on the stacked films and extended in the second direction,wherein the first conductive layer and the second conductive layers are connected in series through the first semiconductor layer, the second semiconductor layer, and the third semiconductor layer, andwherein the first conductive layer and the second conductive layers are connected in series through the first semiconductor layer, the second semiconductor layer, and the fourth semiconductor layer.

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