X-RAY IMAGER WITH SPARSE DETECTOR ARRAY

• US 20130235971A1
• Filed: 03/06/2012
• Published: 09/12/2013
• Est. Priority Date: 02/22/2012
• Status: Active Grant

• Current Assignee: Leidos Security Detection & Automation Incorporated (Leidos Holdings, Inc.)
• Original Assignee: L-3 Communications Security and Detection Systems Incorporated
• Inventors: Oreper, Boris, Foland, Andrew D.
• Granted Patent: US 9,069,092 B2
• Time in Patent Office: Days
• US Class Current: 378/19
• CPC Class Codes: B82Y 30/00 Nanotechnology for materials or surface science, e.g. nanocomposites
• CPC Class Codes: G01N 2223/419 computed tomograph
• CPC Class Codes: G01N 2223/643 object on conveyor
• CPC Class Codes: G01T 1/2985 In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); using external radiation sources A61B6/02
• CPC Class Codes: G01V 5/226 using tomography

Abstract

A system and method for imaging objects with a sparse detector array that includes fewer detectors than conventional x-ray scanning systems. The sparse detector array is positioned to receive x-ray radiation from the at least one x-ray source after passing through an inspection area. The sparse detector array includes a plurality of rows of detector elements, wherein at least some of the plurality of rows are separated by gaps such that the at least some of the plurality of rows are non-contiguous. An iterative reconstruction process is used to determine a volumetric image of the object from the radiation measurements recorded by the detectors in the sparse detector array.

Claims

1. An inspection system, comprising:

an inspection area;

at least one x-ray source adapted to emit x-ray radiation into the inspection area; and

a sparse detector array positioned to receive x-ray radiation from the at least one x-ray source after passing through the inspection area, wherein the sparse detector array includes a plurality of rows of detector elements, wherein at least some of the plurality of rows are separated by gaps such that the at least some of the plurality of rows are non-contiguous.

2. The inspection system of claim 1, further comprising a rotatable gantry, wherein the at least one x-ray source and the sparse detector array are mounted on opposite sides of the rotatable gantry.

3. The inspection system of claim 1, further comprising a conveyor arranged between the at least one x-ray source and the sparse detector array, wherein the conveyor is configured to transport an object through the inspection area.

4. The inspection system of claim 1, wherein a size of the gaps between the rows of the sparse detector array varies along a length of the sparse detector array.

5. The inspection system of claim 4, wherein at least some gaps between rows in the center of the sparse detector array are smaller than gaps between rows at the edges of the sparse detector array.

6. The inspection system of claim 5, wherein at least some rows in the center of the sparse detector array are arranged without gaps between the rows such that the at least some rows in the center of the sparse detector array are contiguous.

7. The inspection system of claim 1, wherein the inspection system is a computed tomography system;

and

wherein the inspection system further comprises at least one processor programmed to construct a three-dimensional image of an item within the inspection area based, at least in part, on outputs of the sparse detector array when irradiated by the at least one x-ray source.

8. The inspection system of claim 6, wherein the at least one processor is further programmed to construct the image using an iterative reconstruction process.

9. The inspection system of claim 2, wherein the plurality of rows of detector elements of the sparse detector array are arranged in an arc on the rotating gantry, and wherein the sparse detector array further comprises at least one additional row of detector elements arranged inside of the arc including the plurality of rows of detector elements.

10. The inspection system of claim 9, wherein the at least one additional row of detector elements comprises at least two additional rows of detector elements arranged on either end of the sparse detector array.

11. The inspection system of claim 1, wherein the sparsity of the sparse detector array is less than 50%.

12. The inspection system of claim 11, wherein the sparsity of the sparse detector array is less than 25%.

13. The inspection system of claim 1, wherein the plurality of rows in the sparse detector array are arranged at an angle relative to a moving direction of a conveyor passing through the inspection area.

14. The inspection system of claim 1, further comprising a conveyor passing through the inspection area, wherein a first distance between the conveyor and the at least one x-ray source is greater than a second distance between the conveyor and the sparse detector array.

15. The inspection system of claim 1, wherein the at least one x-ray source comprises a stationary x-ray source with a plurality of sequential time-multiplexed source positions, and wherein the sparse detector array comprises a fixed detector array arranged to receive x-ray radiation emitted from the stationary x-ray source at each of the plurality of sequential time-multiplexed source positions.

16. The inspection system of claim 15, wherein the stationary x-ray source is an e-beam.

17. The inspection system of claim 1, wherein the at least one x-ray source is configured to emit x-ray radiation having multiple energies including a first energy and a second energy, and wherein the sparse detector array comprises:

a first subset of detector elements more sensitive to x-ray radiation having the first energy than x-ray radiation having the second energy; and

a second subset of detector elements more sensitive to x-ray radiation having the second energy than x-ray radiation having the first energy.

18. The inspection system of claim 1, wherein the at least one x-ray source is configured to emit x-ray radiation having multiple energies including a first energy and a second energy, and wherein at least some of the detector elements in the sparse detector array are configured to classify x-ray radiation received from the at least one x-ray source as having the first energy or the second energy.

19. The inspection system of claim 18, wherein the at least some of the detector elements in the sparse detector array configured to classify x-ray radiation are configured to record individual x-ray photons as having the first energy or the second energy.

20. The inspection system of claim 1, wherein the at least one x-ray source comprises a carbon nanotube x-ray source including a plurality of switchable carbon nanotubes that, when activated in time-sequence by a voltage, emit x-ray radiation.

21. The inspection system of claim 1, wherein the at least one x-ray source comprises a distributed array of switchable x-ray sources that, when activated in time-sequence, emit x-ray radiation.

22. The inspection system of claim 1, wherein the at least one x-ray source comprises a multi-energy x-ray source configured to emit first x-ray radiation having a first energy when a first voltage is applied to the multi-energy x-ray source and configured to emit second x-ray radiation having a second energy when a second voltage is applied to the multi-energy x-ray source.

23. The inspection system of claim 1, wherein at least some of the plurality of rows in the sparse detector array are arranged in layers for multi-energy discrimination of the x-ray radiation received from the at least one x-ray source.

24. The inspection system of claim 2, further comprising:

a power supply adapted to provide power to the at least one x-ray source, wherein the power supply is configured to conform to the structure of the rotating gantry.

25. The inspection system of claim 1, further comprising a rotatable gantry, wherein the at least one x-ray source is mounted on the rotatable gantry and wherein the sparse detector array is stationary.

26. The inspection system of claim 1, further comprising a rotatable platform configured to rotate an object to be imaged within the inspection area.

27. The inspection system of claim 1, further comprising a movable table configured to facilitate the placement of a patient within the inspection area for generating a volumetric image of at least a portion of the patient.

28. The inspection system of claim 1, wherein the inspection system is adapted for imaging small animals and wherein the inspection system further comprises a table configured to facilitate the placement of an animal within the inspection area for generating a volumetric image of at least a portion of the animal.

29. A computer-implemented method for deriving a volumetric image of an object in an inspection area of an x-ray system, wherein the x-ray system includes a sparse detector array having a plurality of non-contiguous rows of detector elements, the method comprising:

receiving at the detector elements in the sparse detector array, a plurality of radiation measurements indicating amounts of radiation passing through the object from different directions, wherein the plurality of radiation measurements include sparsely-spaced measurements in a fan-beam direction of radiation passing through the object; and

performing at least one iteration of an iterative reconstruction process from the plurality of radiation measurements to derive the volumetric image of the object.

30. The computer-implemented method of claim 29, wherein the iterative reconstruction process comprises ordered-subset maximum likelihood, algebraic reconstruction technique, simultaneous algebraic reconstruction technique, simultaneous iterative reconstruction technique, least squares QR method, expectation maximization, ordered-subset expectation maximization, convex method, or orders subset convex method.

31. The computer-implemented method of claim 29, further comprising:

determining a first volumetric image of the object using a direct reconstruction process from the plurality of radiation measurements; and

initializing the iterative reconstruction process with the first volumetric image of the object.

32. The computer-implemented method of claim 31, wherein the direct reconstruction process comprises filtered back projection, direct Fourier reconstruction, analytic cone beam method, or approximate code beam method.

33. An inspection system, comprising:

at least one x-ray source positioned to emit x-ray radiation toward an inspection area in a tunnel, wherein the tunnel includes a conveyor configured to enable an object placed thereon to pass through the inspection area; and

a sparse detector array positioned to receive the x-ray radiation passing through the object, wherein the sparse detector array includes a plurality of rows of detector elements, wherein the detector elements in each row are oriented along the moving direction of the conveyor, and wherein the sparse detector array includes gaps between at least some of the plurality of rows in a direction perpendicular to the moving direction of the conveyor.

34. The inspection system of claim 33, wherein the detector elements in at least one row of the sparse detector array are angled with respect to the moving direction of the conveyor.

35. The inspection system of claim 33, further comprising:

at least one processor programmed to perform an iterative reconstruction process to determine an image of at least a portion of the object from radiation measurements received from the sparse detector array.