SURFACE SHAPE MEASURING DEVICE

• US 20130255396A1
• Filed: 03/28/2013
• Published: 10/03/2013
• Est. Priority Date: 03/30/2012
• Status: Active Grant

• Current Assignee: Korea Advanced Institute of Science and Technology
• Original Assignee: Korea Advanced Institute of Science and Technology
• Inventors: CHO, Young-Ho, KIM, Jae-Min, SEO, Dae-Geon
• Granted Patent: US 9,134,211 B2
• Time in Patent Office: Days
• US Class Current: 73/789
• CPC Class Codes: A61B 5/053 Measuring electrical impedance or conductance of a portion of the body
• CPC Class Codes: A61B 5/0531 Measuring skin impedance
• CPC Class Codes: G01B 7/18 using change in resistance
• CPC Class Codes: G01B 7/22 using change in capacitance
• CPC Class Codes: G01L 1/00 Measuring force or stress, in general measuring force due to impact G01L5/00
• CPC Class Codes: G01L 1/142 using capacitors
• CPC Class Codes: G01L 1/2287 constructional details of the strain gauges adjustable resistors H01C10/00
• CPC Class Codes: G01N 3/08 by applying steady tensile or compressive forces G01N3/28 takes precedence

Abstract

A surface shape measuring device includes a substrate, an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate, a coating layer on the substrate to cover the electrode pattern, and a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto.

Claims

1. A surface shape measuring device, comprising:

a substrate;

an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate;

a coating layer on the substrate to cover the electrode pattern; and

a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto.

2. The device of claim 1, wherein the electrode portion comprises a first electrode pattern and a second electrode pattern spaced apart from each other.

3. The device of claim 2, wherein the detector detects capacitance between the first electrode pattern and the second electrode pattern.

4. The device of claim 2, wherein the first and second electrode patterns extend in a spiral.

5. The device of claim 4, wherein the spacing distance between the first and second electrode patterns remains constant as each of the first and second electrode patterns revolves around the central point.

6. The device of claim 4, wherein the spacing distance between the first and second electrode patterns is changed as each of the first and second electrode patterns revolves around the central point.

7. The device of claim 1, wherein the electrode pattern extends in a serpentine shape.

8. The device of claim 7, wherein the detector detects a resistance of the electrode pattern.

9. The device of claim 1, wherein the electrode portion comprises a plurality of the electrode patterns arranged in a matrix shape.

10. The device of claim 7, wherein the substrate or the coating layer further comprises a protrusion on a surface thereof to contact with a surface of an object.

11. The device of claim 1, further comprising a calculator connected to the detector to calculate a variation in a surface shape based on the detected change in the physical quantity.