SEMICONDUCTOR TESTING APPARATUS
First Claim
1. A semiconductor testing apparatus comprising a printed circuit board, and a test socket mounted on an upper surface of the printed circuit board and forming a signal connection path between a test object and the printing circuit board,wherein a chip shaped capacitor is mounted on the upper surface of the printed circuit board, an interference avoidance space avoiding contact with the capacitor is formed in the test socket, the interference avoidance space being formed at a location facing the location where the capacitor is mounted, andthe capacitor and the test socket being non-contacted from each other by the interference avoidance space.
1 Assignment
0 Petitions
Accused Products
Abstract
A semiconductor testing apparatus is provided wherein components that must be arranged most closely are arranged most closely to terminals of a test object. The present apparatus is semiconductor testing apparatus comprising a printed circuit board, and a test socket mounted on an upper surface of the printed circuit board and forming a signal connection path between a test object and the printing circuit board, wherein a chip shaped capacitor is mounted on the upper surface of the printed circuit board, an interference avoidance space avoiding contact with the capacitor is formed in the test socket, the interference avoidance space being formed at a location facing the location where the capacitor is mounted, and the capacitor and the test socket being non-contacted from each other by the interference avoidance space.
10 Citations
7 Claims
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1. A semiconductor testing apparatus comprising a printed circuit board, and a test socket mounted on an upper surface of the printed circuit board and forming a signal connection path between a test object and the printing circuit board,
wherein a chip shaped capacitor is mounted on the upper surface of the printed circuit board, an interference avoidance space avoiding contact with the capacitor is formed in the test socket, the interference avoidance space being formed at a location facing the location where the capacitor is mounted, and the capacitor and the test socket being non-contacted from each other by the interference avoidance space.
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5. A semiconductor testing apparatus comprising a printed circuit board, and a test socket mounted on an upper surface of the printed circuit board and forming a signal connection path between a test object and the printing circuit board,
wherein the test socket comprises a lower socket mounted on the upper surface of the printed circuit board; - a middle circuit board mounted on an upper surface of the lower socket; and
an upper socket mounted on an upper surface of the middle circuit board;the middle circuit board is bigger than the upper socket and a spare mounting space big enough to have space left even after the upper socket is mounted thereon is formed on the upper middle circuit board, and a component for signal improvement is mounted on the spare mounting space. - View Dependent Claims (6, 7)
- a middle circuit board mounted on an upper surface of the lower socket; and
Specification