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FLASH MEMORY LIFETIME EVALUATION METHOD

  • US 20130262942A1
  • Filed: 03/27/2012
  • Published: 10/03/2013
  • Est. Priority Date: 03/27/2012
  • Status: Abandoned Application
First Claim
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1. A flash memory lifetime evaluation method, provided for a control center to dynamically amend, detect and evaluate an ideal lifetime of a built-in or extended flash memory of an electronic device, and the method comprising the steps of:

  • detecting a capacity of a memory block, a memory page and a memory cell in the flash memory, and calculating the ideal lifetime of the flash memory by a structure type of the flash memory;

    creating a spare area in at least one of the flash memory and the control center;

    generating a testing command by the control center and transmitting the testing command to the flash memory, such that the flash memory executes a memory test according to the testing command, and the flash memory feeds back a test result to the spare area according to the memory test to form an amend parameter; and

    retrieving the amend parameter in the spare area by the control center, to selectively amend the ideal lifetime by the amend parameter.

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