MEASUREMENT DEVICE AND METHOD OF GRAPHIC PROCESSING FOR MEASURING ELEMENTS OF OBJECTS

• US 20130265313A1
• Filed: 04/02/2013
• Published: 10/10/2013
• Est. Priority Date: 04/09/2012
• Status: Abandoned Application

• Current Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Inventors: CHANG, CHIH-KUANG, WU, XIN-YUAN, ZHANG, ZHENG-ZHI
• Application Number:
  US13/855,701
• Publication Number:
  US 20130265313A1
• Time in Patent Office: Days
• US Class Current: 345/440
• CPC Class Codes: G01B 21/04 by measuring coordinates of points
• CPC Class Codes: G06T 11/206 Drawing of charts or graphs

Abstract

In a measurement device and a method of graphic processing for measuring elements of an object, original measuring points which are sampled on the object are acquired, a measuring element is fitted using the original measuring points. Vectors of the original measuring points are computed based on the measuring element, and the measuring element and the original measuring points are drawn based on the vectors. New measuring points are generated according to a number of the original measuring points, and corrected coordinates of the new measuring points are computed according to a predetermined deviation. The new measuring points are drawn on the measuring element according to the corrected coordinates, and the original measuring points are deleted from the measuring element. A measuring sequence of the new measuring points is determined to generate a measuring program.

Claims

1. A method of graphic processing for measuring elements of an object, the method being performed by execution of computerized codes by a processor of a measurement device, the method comprising:

acquiring original measuring points which are selected on the object, and obtaining a measuring element which is fitted using the original measuring points;

computing vectors of the original measuring points based on the measuring element;

drawing the measuring element and the original measuring points based on the vectors;

generating new measuring points according to a number of the original measuring points;

computing corrected coordinates of the new measuring points according to a predetermined deviation;

drawing the new measuring points on the measuring element according to the corrected coordinates, and deleting the original measuring points from the measuring element; and

determining a measuring sequence of the new measuring points, generating a measuring program according to the measuring sequence, and outputting the measuring program on a display device of the measurement device.

2. The method according to claim 1, wherein the measuring element is one type of a line, a plane, a circle, a cylinders, and a sphere.

3. The method according to claim 2, before obtaining a measuring element, the method further comprising:

fitting each type of the measuring element using the original measuring points;

computing a fitting deviation of each of the fitted measuring elements; and

obtaining the measuring element which has the least fitting deviation.

4. The method according to claim 1, wherein:

the vectors are vertical to the measuring element upon condition that the measuring element is a line;

the vectors are pointed to the center of the measuring element upon condition that the measuring element is a circle;

the vectors are vertical to the measuring element upon condition that the measuring element is a plane;

the vectors are vertical to the center axis of the measuring element upon condition that the measuring element is a cylinder; and

the vectors are pointed to the center of the measuring element upon condition that the measuring element is a sphere.

5. The method according to claim 1, before generating new measuring points, the method further comprising:

generating a parameter adjusting window, and displaying the parameter adjusting window on the display device, wherein the parameter adjusting window comprises a type box for selecting a measuring element, a number box for adjusting a number of the new measuring points of the selected measuring element, and a deviation box for adjusting the deviation of the selected measuring element.

6. The method according to claim 1, wherein the new measuring points are distributed equally on the measuring element.

7. A measurement device, comprising:

a non-transitory storage device;

at least one processing device; and

one or more modules that are stored in the non-transitory storage device and executed by the at least one processing device, the one or more modules comprising instructions to;

acquire original measuring points which are sampled on an object, and obtain a measuring element which is fitted using the original measuring points;

compute vectors of the original measuring points based on the measuring element;

draw the measuring element and the original measuring points based on the vectors;

generate new measuring points according to a number of the original measuring points;

compute corrected coordinates of the new measuring points according to a predetermined deviation;

draw the new measuring points on the measuring element according the corrected coordinates, and delete the original measuring points from the measuring element; and

determine a measuring sequence of the new measuring points, generate a measuring program according to the measuring sequence, and output the measuring program on a display device of the measurement device.

8. The measurement device according to claim 7, wherein the measuring element is one type of a line, a plane, a circle, a cylinders, and a sphere.

9. The measurement device according to claim 8, wherein the one or more modules further comprises instructions to:

fit each type of the measuring element using the original measuring points;

compute a fitting deviation of each of the fitted measuring elements; and

obtain the measuring element which has the least fitting deviation.

10. The measurement device according to claim 7, wherein:

the vectors are vertical to the measuring element upon condition that the measuring element is a line;

the vectors are pointed to the center of the measuring element upon condition that the measuring element is a circle;

the vectors are vertical to the measuring element upon condition that the measuring element is a plane;

the vectors are vertical to the center axis of the measuring element upon condition that the measuring element is a cylinder; and

the vectors are pointed to the center of the measuring element upon condition that the measuring element is a sphere.

11. The measurement device according to claim 7, wherein the one or more modules further comprises instructions to:

generate a parameter adjusting window, and display the parameter adjusting window on the display device, wherein the parameter adjusting window comprises a type box for selecting a measuring element, a number box for adjusting a number of the new measuring points of the selected measuring element, and a deviation box for adjusting the deviation of the selected measuring element.

12. The measurement device according to claim 7, wherein the new measuring points are distributed equally on the measuring element.

13. A non-transitory storage medium having stored thereon instructions that, when executed by a processor of an measurement device, causes the processor to perform a method of graphic processing for measuring elements of an object, wherein the method comprises:

acquiring original measuring points which are sampled on the object, and obtaining a measuring element which is fitted using the original measuring points;

computing vectors of the original measuring points based on the measuring element;

drawing the measuring element and the original measuring points based on the vectors;

generating new measuring points according to a number of the original measuring points;

computing corrected coordinates of the new measuring points according to a predetermined deviation;

drawing the new measuring points on the measuring element according the corrected coordinates, and deleting the original measuring points from the measuring element; and

determining a measuring sequence of the new measuring points, generating a measuring program according to the measuring sequence, and outputting the measuring program on a display device of the measurement device.

14. The non-transitory storage medium according to claim 13, wherein the measuring element is one type of a line, a plane, a circle, a cylinders, and a sphere.

15. The non-transitory storage medium according to claim 14, before obtaining a measuring element, wherein the method further comprises:

fitting each type of the measuring element using the original measuring points;

computing a fitting deviation of each of the fitted measuring elements; and

obtaining the measuring element which has the least fitting deviation.

16. The non-transitory storage medium according to claim 13, wherein:

the vectors are vertical to the measuring element upon condition that the measuring element is a line;

the vectors are pointed to the center of the measuring element upon condition that the measuring element is a circle;

the vectors are vertical to the measuring element upon condition that the measuring element is a plane;

the vectors are vertical to the center axis of the measuring element upon condition that the measuring element is a cylinder; and

the vectors are pointed to the center of the measuring element upon condition that the measuring element is a sphere.

17. The non-transitory storage medium according to claim 13, before generating new measuring points, wherein the method further comprises:

generating a parameter adjusting window, and displaying the parameter adjusting window on the display device, wherein the parameter adjusting window comprises a type box to select a measuring element, a number box to adjust a number of the new measuring points of the selected measuring element, and a deviation box to adjust the deviation of the selected measuring element.

18. The non-transitory storage medium according to claim 13, wherein the new measuring points are distributed equally on the measuring element.