SEMICONDUCTOR DEVICE AND ELECTRICAL TERMINAL

• US 20130268792A1
• Filed: 04/09/2013
• Published: 10/10/2013
• Est. Priority Date: 04/10/2012
• Status: Active Grant

• Current Assignee: LAPIS Semiconductor Co., Ltd. (ROHM Co., Ltd.)
• Original Assignee: LAPIS Semiconductor Co., Ltd. (ROHM Co., Ltd.)
• Inventors: SAITOU, Takayuki
• Granted Patent: US 9,298,248 B2
• Time in Patent Office: Days
• US Class Current: 713/323
• CPC Class Codes: G06F 1/3206 Monitoring of events, devices or parameters that trigger a change in power modality
• CPC Class Codes: G06F 1/3234 Power saving characterised by the action undertaken

Abstract

A semiconductor device includes a moving state determining unit for obtaining first sensor data from a first sensor for detecting a moving state of a user who possesses an electrical terminal so that the moving state determining unit performs a determination process of the moving state of the electrical terminal; a reliability information determining unit for determining reliability information indicating reliability of a determination result of the determination process; and a transmission processing unit for transmitting the determination result and the reliability information to a main control unit that controls the electrical terminal.

Claims

1. A semiconductor device, comprising:

a moving state determining unit for obtaining first sensor data from a first sensor for detecting a moving state of a user who possesses an electrical terminal so that the moving state determining unit performs a determination process of the moving state of the electrical terminal;

a reliability information determining unit for determining reliability information indicating reliability of a determination result of the determination process; and

a transmission processing unit for transmitting the determination result and the reliability information to a main control unit that controls the electrical terminal.

2. The semiconductor device according to claim 1, wherein said reliability information determining unit is configured to determine that the reliability information is set to a first value when the moving state determining unit performs the determination process for a period of time longer than a specific level, and

said reliability information determining unit is configured to determine that the reliability information is set to a second value indicating that the reliability is higher than that of the first value when the moving state determining unit performs the determination process for a period of time shorter than a specific level.

3. The semiconductor device according to claim 1, further comprising a storage unit for storing the first sensor data;

and a data control unit for transmitting the first sensor data to the main control unit when the main control unit transmits a response to request transmission of the first sensor data, said data control unit being configured to allow the first sensor data to be deleted when the main control unit transmits a response to not request the transmission of the first sensor data.

4. The semiconductor device according to claim 1, further comprising a reception unit for receiving a validation result of the main control unit relative to the determination result;

and a change control unit for changing an execution condition of the determination process when the validation result indicates that the determination result is not valid.

5. The semiconductor device according to claim 1, wherein said moving state determining unit is configured to obtain second sensor data from a second sensor so that the moving state determining unit performs the determination process using the second sensor data when the validation result indicates that the determination result is not valid.

6. An electrical terminal comprising:

a sensor for detecting a moving state of a user who possesses an electrical terminal;

a semiconductor device for controlling the sensor; and

a main control unit for controlling the electrical terminal,

wherein said semiconductor device comprises;

a moving state determining unit for obtaining sensor data from the sensor so that the moving state determining unit performs a determination process of the moving state of the electrical terminal;

a reliability information determining unit for determining reliability information indicating reliability of a determination result of the determination process;

a transmission processing unit for transmitting the determination result and the reliability information to the main control unit that controls the electrical terminal; and

a storage unit for storing the sensor data, and said main control unit comprises;

a reception unit for receiving the determination result and the reliability information;

a validation processing unit for performing a validation process relative to the determination result when the reliability information meets a specific condition; and

a display processing unit for displaying a validation result of the validation processing unit.

7. The electrical terminal according to claim 6, wherein said validation processing unit is configured to request the semiconductor device to transmit the sensor data when the reliability information meets a first condition so that the validation processing unit performs the validation process relative to the determination result using the sensor data, and

said validation processing unit is configured to perform the validation process relative to the determination result using data obtained from a main control unit sensor connected to the main control unit when the reliability information meets a second condition.

8. The electrical terminal according to claim 6, wherein said main control unit further includes a validation result notification unit for notifying the validation result to the semiconductor device when the validation processing unit performs the validation process.