METHOD AND DEVICE FOR TESTING LIGHT-EMITTING DIODE DIE

• US 20130301050A1
• Filed: 08/24/2012
• Published: 11/14/2013
• Est. Priority Date: 05/14/2012
• Status: Abandoned Application

• Current Assignee: Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hon Hai Precision Industry Co., Ltd.
• Inventors: TSENG, Kuo-Fong
• Application Number:
  US13/593,527
• Publication Number:
  US 20130301050A1
• Time in Patent Office: Days
• US Class Current: 356/402
• CPC Class Codes: G01J 2001/4252 for testing LED's
• CPC Class Codes: G01J 3/0218 using optical fibers
• CPC Class Codes: G01J 3/0264 Electrical interface; User interface
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01N 21/95 characterised by the material or shape of the object to be examined G01N21/89 - G01N21/91, G01N21/94 take precedence
• CPC Class Codes: H01L 33/0095 Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination

Abstract

A method for testing an LED die includes the following steps: setting control parameters; driving the LED die to emit light by applying an electric current to the LED die under the control parameters; detecting the wavelength of the light emitted by the LED die; and determining whether the LED die meets the predetermined electro-optical properties, based upon the relationship between the control parameters and the wavelength.

Claims

1. A testing device for testing a light-emitting diode (LED) die, the testing device comprising:

a power supply for supplying an electric current to cross the LED die to make the LED die emit light;

a spectrum analyzer configured to detect the wavelength of the light emitted by the LED die; and

a processor in communication with the power supply and the spectrum analyzer, the processor comprising;

a storage unit storing a plurality of standard ranges of wavelengths of lights emitted by a qualified LED die, each of the standard ranges corresponding to an output power level of the power supply;

a user interface configured for receiving user inputs, thus to determine control parameters of the power supply;

a control unit configured for receiving the control parameters and controlling the power supply to output a certain level of electric current across the LED die to make the LED die emit light under the control parameters, the control unit also controlling the spectrum analyzer to detect the wavelength of the light emitted by the LED die and detected by the spectrum analyzer; and

an analyzer unit configured for analyzing whether or not electro-optical properties of the LED die achieve the required and predetermined electro-optical properties, according to a power value supplied by the power supply to the LED die, and the wavelength of the light emitted by the LED die.

2. The testing device of claim 1, wherein the power supply comprises a current and voltage meter to display the current and voltage values output by the power supply.

3. The testing device of claim 2, wherein the power supply comprises two probes for electrically connecting to an anode electrode and a cathode electrode of the LED die.

4. The testing device of claim 1, further comprising a chuck to hold the LED die.

5. The testing device of claim 4, further comprising a support and a first cantilever, wherein the support is positioned on the chuck, the first cantilever is positioned above the chuck.

6. The testing device of claim 5, wherein the support comprises a rotary plate, a second cantilever and a camera module, the first cantilever extends from the rotary plate, the second cantilever extends from the rotary plate, the camera module is positioned on the second cantilever and can be positioned to directly face the LED die by rotating the rotary plate.

7. A method for testing an LED die, the method comprising:

setting control parameters;

driving the LED die to emit light by applying an electric current to the LED die under the control parameters;

detecting the wavelength of the light emitted by the LED die; and

determining whether the LED die meets the predetermined electro-optical properties, based upon a relationship between the control parameters and the wavelength of the light.

8. The method of claim 7, wherein before the step of setting control parameters, the method comprises:

capturing an image of the LED die;

displaying the image; and

analyzing whether or not the LED die has cosmetic defects based upon the image of the LED die.