RETRACTABLE TEST PROBE

• US 20130307527A1
• Filed: 05/21/2012
• Published: 11/21/2013
• Est. Priority Date: 05/21/2012
• Status: Active Grant

• Current Assignee: Chung Instrument Electronics Industrial Co., Ltd.
• Original Assignee: Chung Instrument Electronics Industrial
• Inventors: LIU, Shaw-Lin
• Granted Patent: US 8,907,659 B2
• Time in Patent Office: Days
• US Class Current: 324/149
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

Abstract

The retractable test probe includes a main sleeve, a needle and a rotation positioning mechanism. The needle is rooted in the main sleeve. The rotation positioning mechanism includes an eccentric incoaxially fastened to the needle and a flexible sleeve around the eccentric and in the main sleeve. When the needle is turned towards a specific direction, the eccentric will be firmly fastened in the main sleeve through the flexible sleeve, when the needle is turned reversely, the eccentric will be released from the flexible sleeve to be retractably movable.

Claims

1. A retractable test probe comprising:

a main sleeve;

a needle rooted in the main sleeve; and

a rotation positioning mechanism, comprising an eccentric incoaxially fastened to the needle and a flexible sleeve around the eccentric and in the main sleeve;

wherein when the needle is turned towards a specific direction, the eccentric will be firmly fastened in the main sleeve through the flexible sleeve, when the needle is turned reversely, the eccentric will be released from the flexible sleeve to be retractably movable.

2. The test probe of claim 1, further comprising a conductive sleeve put around a conduction portion of the needle within the main sleeve to electrically connect with the needle.

3. The test probe of claim 2, wherein the conductive sleeve has a conductive elastic sheet nipped between the conduction portion and the conductive sleeve.

4. The test probe of claim 3, further comprising a copper tube assembly, wherein the copper tube assembly comprises a first copper tube and a second copper tube, which are longitudinally connected to each other, and the conductive sleeve is received in the second copper tube and sandwiched between the first copper tube and the second copper tube.

5. The test probe of claim 2, further comprising an insulation sleeve extending from an end of the eccentric, put around the needle and received in the main sleeve.

6. The test probe of claim 5, wherein the needle has a test portion protrudent from the insulation sleeve.

7. The test probe of claim 1, wherein the flexible sleeve is formed with a recess, two ends of the recess are separately formed with two stopping portions, the eccentric is formed with a positioning block received in the recess, and the stopping portions are used for limiting the positioning block.

8. The test probe of claim 1, wherein the flexible sleeve is formed with a slot.

9. The test probe of claim 1, wherein thickness of the flexible sleeve is uneven and continuously varying.