METHOD AND SYSTEM EMPLOYING A SOLUTION CONTACT FOR MEASUREMENT
First Claim
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1. A metrology system for analyzing a semiconductor device comprising:
- an electrolytic cell comprising;
a source of an electrolyte solution configured to provide the electrolyte solution in contact with at least a portion of a semiconductor material of the semiconductor device; and
a first electrode in contact with a provided electrolyte solution to enable measurement of electrical characteristics of the semiconductor device, wherein the portion of the semiconductor material of the semiconductor device acts as a second electrode when contacted by the electrolyte solution; and
a measurement circuit for taking electrical measurements using the electrolyte solution and the first electrode.
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Abstract
An inline metrology method and system using an electrolytic cell for measuring electrical characteristics of a semiconductor device, such as a photovoltaic device, during manufacture.
9 Citations
37 Claims
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1. A metrology system for analyzing a semiconductor device comprising:
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an electrolytic cell comprising; a source of an electrolyte solution configured to provide the electrolyte solution in contact with at least a portion of a semiconductor material of the semiconductor device; and a first electrode in contact with a provided electrolyte solution to enable measurement of electrical characteristics of the semiconductor device, wherein the portion of the semiconductor material of the semiconductor device acts as a second electrode when contacted by the electrolyte solution; and a measurement circuit for taking electrical measurements using the electrolyte solution and the first electrode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. A method of analyzing a semiconductor device during a semiconductor device manufacturing process comprising:
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applying an electrolyte solution to at least a portion of a semiconductor material of the semiconductor device; applying a first electrode to the electrolyte solution, wherein the first electrode is configured to enable measurement of electrical characteristics of the semiconductor device and wherein the portion of the semiconductor material of the semiconductor device acts as a second electrode when being analyzed; applying at least one of a voltage and current to the electrolyte solution; and analyzing at least one electrical characteristic of the semiconductor device based on the one of a voltage and current applied to the electrolyte solution. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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Specification