LIGHT SCANNING MICROSCOPE AND MICROSCOPY METHOD
First Claim
1. Light scanning microscope, comprising:
- an illumination module, which generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample for the purpose of exciting sample radiation;
a detector module for confocal detection of the sample radiation excited by each spot, the detector module comprising a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes which are located in a pinhole plane, wherein the diaphragm, upon rotation, is located at least partially in the imaging beam path for the purpose of confocal detection;
a second detector disposed outside of the imaging beam path; and
a first beam splitter disposed in the imaging beam path between the sample and the diaphragm, wherein the beam splitter deflects sample radiation, reflected by the diaphragm, onto the second detector.
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Abstract
A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector.
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Citations
16 Claims
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1. Light scanning microscope, comprising:
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an illumination module, which generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample for the purpose of exciting sample radiation; a detector module for confocal detection of the sample radiation excited by each spot, the detector module comprising a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes which are located in a pinhole plane, wherein the diaphragm, upon rotation, is located at least partially in the imaging beam path for the purpose of confocal detection; a second detector disposed outside of the imaging beam path; and a first beam splitter disposed in the imaging beam path between the sample and the diaphragm, wherein the beam splitter deflects sample radiation, reflected by the diaphragm, onto the second detector. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A microscopy method, comprising:
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generating several illumination beams; moving each illumination beam, as a spot, in a predefined region of a sample, to exciting sample radiation; detectiong the sample radiation excited by each spot confocally by a detector module, the detector module comprising a first detector, an imaging lens system for imaging the predefined region along an imaging beam path running from the sample as far as the detector, and a rotatable diaphragm with several pinholes; rotationg the diaphragm such that it is located at least partially in the imaging beam path for the purpose of confocal detection, disposing a second detector outside of the imaging beam path disposing a beam splitter in the imaging beam path between the sample and the diaphragm; and deflecting with the beam splitter the sample radiation, coming from the diaphragm, onto the second detector.
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Specification