TEST SYSTEM

• US 20130325248A1
• Filed: 05/21/2013
• Published: 12/05/2013
• Est. Priority Date: 05/23/2012
• Status: Active Grant

• Current Assignee: Horiba Limited
• Original Assignee: Horiba Limited
• Inventors: URATANI, Katsumi, HACHIUMA, Katsuhiro
• Granted Patent: US 9,322,743 B2
• Time in Patent Office: Days
• US Class Current: 701/31.4
• CPC Class Codes: G01M 15/102 by monitoring exhaust gases
• CPC Class Codes: G01M 17/00 Testing of vehicles testing fluid tightness G01M3/00; testing elastic properties of bodies or chassis, e.g. torsion-testing, G01M5/00; testing alignment of vehicle headlight devices G01M11/06; testing of engines G01M15/00
• CPC Class Codes: G01M 17/007 Wheeled or endless-tracked vehicles G01M17/08 takes precedence

Abstract

This invention is a test system 1 that is used for a mobile object such as a vehicle or a component used for the mobile object, and the test system 1 comprises one or a plurality of devices for test 4 used for a test and a device administrating device 7 that is connected to the device for test 4 in a communicable manner and that administrates the device for test 4, and is characterized by that the device administrating device 7 or the device for test 4 comprises a QC storing part 45 that stores a regulation ID to identify a regulation for the test and a quality check time or item to be provided for the device for test 4 in a mutually associated manner.

Claims

1. A test system to test an object to be tested with a mobile object such as a vehicle, a ship or an airplane, or a component used for the mobile object being as the object to be tested, wherein

one or a plurality of devices for test used for the test and a device administrating device that is connected to the device for test in a communicable manner and that administrates the device for test are comprised, and

a QC storing part that stores a regulation ID to identify a regulation for the test and a quality check time or item to be provided for the device for test in a mutually associated manner is provided for the device administrating device or the device for test.

2. The test system described in claim 1, wherein

the device administrating device comprises

a regulation receiving part that receives designation of the regulation and

a display part that obtains the quality check time or item corresponding to the regulation received by the regulation receiving part and displays the obtained quality check time or item.

3. The test system described in claim 2, wherein

the device administrating device further comprises

a quality check set receiving part that receives an input for changing the quality check time or item displayed by the display part and that reflects the changed input on the QC storing part.

4. The test system described in claim 1, wherein

the device administrating device or the device for test further comprises

a previous quality check completion time storing part that stores a previous quality check completion time as being a time when the quality check that is previously provided for the device for test is completed, and

the device administrating device further comprises

a next quality check initiation time calculating part that calculates a next quality check initiation time as being a time when the next quality check is initiated for the device for test by obtaining the quality check time from the QC storing part and by adding the obtained quality check time to the previous quality check completion time.

5. The test system described in claim 4, wherein

the device administrating device further comprises

an information set receiving part that receives an input of information for determining a previous warning issue time as being a time prior to the next quality check initiation time, and

the device administrating device or the device for test further comprises

a warning issue part that issues a warning that can be recognized by an operator at a time when the time reaches the previous warning issue time.