Leak Testing Methods and Systems
First Claim
1. A method of leak testing a device under test (DUT) comprising the steps of:
- a) filling the DUT with a fluid to a predetermined pressure using a first regulator R2 and first valve V1 disposed in series between a source of the fluid and the DUT via a first process sequence comprising a first set of characteristics;
b) measuring with a high accuracy flow controller F1 a measured flow waveform via a second process sequence comprising a second set of characteristics; and
c) calculating with a microprocessor a leak rate for the DUT in dependence upon at least the measured flow waveform.
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Accused Products
Abstract
Leak rate testing is an engineering challenge where on the one hand, engineers must meet strict leak rate standards on a wide range of products and systems from semiconductor packages through medical product packaging to chemical storage vessels and liquid/gas handling systems. On the other hand, they have to make the leak testing process low cost and independent of operator whilst in many applications making the process automated and fast as this step may otherwise become a manufacturing bottleneck. Accordingly embodiments of the invention address manufacturing requirements by providing for high accuracy flow based leak testing of large volumes, providing adaptive techniques for use during testing, providing equivalent circuit modeling techniques allowing optimization and parameter extraction to be simulated prior to manufacturing commitment, and providing for the automatic tuning of setup parameters.
9 Citations
15 Claims
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1. A method of leak testing a device under test (DUT) comprising the steps of:
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a) filling the DUT with a fluid to a predetermined pressure using a first regulator R2 and first valve V1 disposed in series between a source of the fluid and the DUT via a first process sequence comprising a first set of characteristics; b) measuring with a high accuracy flow controller F1 a measured flow waveform via a second process sequence comprising a second set of characteristics; and c) calculating with a microprocessor a leak rate for the DUT in dependence upon at least the measured flow waveform. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of leak testing a device under test (DUT) comprising the steps of:
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a) establishing a leak test protocol comprising at least a first set of characteristics related to at least one of a filling and stabilization process, a second set of characteristics related to a testing process, and a third set of chracteristics relating to an exhaust process; b) preparing the DUT with a fluid to a predetermined pressure using a first regulator R2 and first valve V1 disposed in series between a source of the fluid and the DUT via a first process sequence comprising the first set of characteristics; c) measuring with a high accuracy flow controller F1 a measured flow waveform via a second process sequence comprising the second set of characteristics; d) performing an exhaust process to allow replacement of the DUT; and e) calculating with a microprocessor a leak rate for the DUT in dependence upon at least the measured flow waveform. - View Dependent Claims (9, 10)
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11. A method of leak testing a device under test (DUT) comprising:
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providing a leak testing pneumatic circuit comprising at least an inlet for connection to a source of fluid, a pressure regulator, a first valve coupled to the regulator and a second valve, a pressure sensor coupled to the output of the second valve, and an outlet coupled to the output of the second valve for coupling to the DUT; executing a leak test sequence for a DUT by cycling the first and second valves through a predetermined sequence to selectively perform at least one of a system check, a filling step, a stabilization step, a testing step, and an exhaust step;
whereinthe output of the pressure sensor is continuously acquired by a microprocessor to perform a full flow waveform analysis as part of a quality assurance step for the DUT. - View Dependent Claims (12, 13, 14, 15)
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Specification