SIMULATOR, SIMULATION METHOD, AND SIMULATION PROGRAM FOR SEMICONDUCTOR DEVICES

• US 20130332138A1
• Filed: 05/21/2013
• Published: 12/12/2013
• Est. Priority Date: 06/08/2012
• Status: Abandoned Application

• Current Assignee: Renesas Electronics Corporation
• Original Assignee: Renesas Electronics Corporation
• Inventors: Koga, Yasuhiro
• Application Number:
  US13/899,414
• Publication Number:
  US 20130332138A1
• Time in Patent Office: Days
• US Class Current: 703/14
• CPC Class Codes: G06F 2111/02 CAD in a network environment, e.g. collaborative CAD or distributed simulation
• CPC Class Codes: G06F 30/36 Circuit design at the analogue level
• CPC Class Codes: G06F 30/367 Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Abstract

A web simulator of a semiconductor device having an AFE unit whose circuit configuration can be altered comprises a sensor selector that selects a sensor to be coupled to the AFE unit; a bias circuit selector that selects a bias circuit to be coupled to the selected sensor; a circuit configuration setting unit that sets the circuit configuration of the AFE unit to be coupled to the selected sensor and bias circuit; and a simulation executing unit that executes simulation of a coupled circuit combination comprising the selected sensor and bias circuit and the AFE unit of the set circuit configuration.

Claims

1. A simulator for semiconductor devices having an analog front end circuit whose circuit configuration can be altered, comprising:

a bias circuit information memory that stores information from sensors and a plurality of bias circuits supplying bias signals to the sensors;

a sensor selector that selects a sensor to be coupled to the analog front end circuit;

a bias circuit display unit that references the bias circuit information memory and displays the bias circuits matching the selected sensor;

a bias circuit selector that selects a bias circuit to be coupled to the selected sensor out of the displayed bias circuits;

a circuit configuration setting unit that sets the circuit configuration of the analog front end circuit to be coupled to the selected sensor and bias circuit; and

a simulation executing unit that simulates a coupling circuit that couples the selected sensor and bias circuit and the analog front end circuit of the set circuit configuration.

2. The simulator for semiconductor devices according to claim 1, further comprising:

a sensor information memory that stores the sensor and the type of the sensor associated with each other;

wherein;

the sensor selector selects the sensor matching the type of the selected sensor on the basis of the association by the sensor information memory.

3. The simulator for semiconductor devices according to claim 2, further comprising:

a sensor display unit that references the sensor information memory and displays a plurality of sensors matching the type of the sensor selected by the user, wherein;

the sensor selector selects the sensor out of the displayed sensors in accordance with the user'"'"'s operation.

4. The simulator for semiconductor devices according to claim 3, wherein the sensor display unit references the sensor information memory and displays sensors of the type of the sensor selected by the user and satisfying the user-designated conditions of search for sensors.

5. The simulator for semiconductor devices according to claim 1, further comprising:

an analog circuit information memory that stores the sensor and bias circuit and the circuit configuration of the analog front end circuit coupled to the sensor via the bias circuit associated with each other, wherein;

the circuit configuration setting unit references the analog circuit information memory and sets the circuit configuration of the analog front end circuit matching the selected sensor and bias circuit.

6. The simulator for semiconductor devices according to claim 1, wherein the circuit configuration setting unit that sets the circuit configuration of a configurable amplifier contained in the analog front end circuit correspondingly to the selected sensor and bias circuit.

7. The simulator for semiconductor devices according to claim 1, wherein the circuit configuration setting unit that sets the coupling relationship between the output terminals of the selected sensor and bias circuit and the input terminal of the analog front end circuit.

8. The simulator for semiconductor devices according to claim 1, further comprising:

a circuit characteristics setting unit that sets the circuit characteristics of the analog front end circuit on the basis of the selected sensor and bias circuit.

9. The simulator for semiconductor devices according to claim 8, wherein the circuit characteristics setting unit so sets the gain and offset of the analog front end circuit that the output signal of the analog front end circuit is kept within the operable range of the analog front end circuit.

10. The simulator for semiconductor devices according to claim 1, further comprising:

a semiconductor device information memory that stores a semiconductor device including the analog front end circuit and a circuit capable of configuring the pertinent analog front end circuit associated with each other; and

a semiconductor device selector that selects as an object of simulation of the semiconductor device having an analog front end circuit of the set circuit configuration on the basis of association by the semiconductor device information memory.

11. The simulator for semiconductor devices according to claim 10, further comprising:

a semiconductor device display unit that references the semiconductor device information memory and displays a plurality of semiconductor devices matching an analog front end circuit of the set circuit configuration,

wherein the semiconductor device selector selects the semiconductor device out of the displayed plurality of semiconductor devices in accordance with the user'"'"'s operation.

12. The simulator for semiconductor devices according to claim 11, wherein the semiconductor device display unit references the semiconductor device information memory and displays a plurality of semiconductor devices having an analog front end circuit of the set circuit configuration and satisfying the user-designated conditions of search for sensors.

13. A simulation method for semiconductor devices including an analog front end circuit whose circuit configuration can be altered, comprising:

storing in a bias circuit information memory a sensor and a plurality of bias circuits that supply bias signals to the sensor;

selecting a sensor to be coupled to the analog front end circuit;

referencing the bias circuit information memory and displaying the plurality of bias circuits matching the selected sensor;

selecting out of the displayed plurality of bias circuits a bias circuit to be coupled to the selected sensor in accordance with the user'"'"'s operation;

setting the circuit configuration of the analog front end circuit to be coupled to the selected sensor and bias circuit; and

executing simulation of a coupled circuit comprising the selected sensor and bias circuit and an analog front end circuit of the set circuit configuration being coupled to each other.

14. A computer readable medium storing a simulation program that causes a computer to execute a process for simulation of a semiconductor device having an analog front end circuit whose circuit configuration can be altered, the process comprising:

storing in a bias circuit information memory a sensor and a plurality of bias circuits that supply bias signals to the sensor;

selecting a sensor to be coupled to the analog front end circuit;

referencing the bias circuit information memory and displaying the plurality of bias circuits matching the selected sensor;

selecting out of the displayed plurality of bias circuits a bias circuit to be coupled to the selected sensor in accordance with the user'"'"'s operation;

setting the circuit configuration of the analog front end circuit to be coupled to the selected sensor and bias circuit; and

executing simulation of a coupled circuit combination comprising the selected sensor and bias circuit and an analog front end circuit of the set circuit configuration.