MULTIPLE LIGHT SOURCE MICROSCOPE

• US 20130335817A1
• Filed: 01/05/2011
• Published: 12/19/2013
• Est. Priority Date: 01/05/2011
• Status: Abandoned Application

• Current Assignee: Shinichiro Isobe
• Original Assignee: Shinichiro Isobe
• Inventors: Isobe, Shinichiro, Kanemaru, Takaaki, Takasu, Shin-ichi
• Application Number:
  US13/976,556
• Publication Number:
  US 20130335817A1
• Time in Patent Office: Days
• US Class Current: 359/363
• CPC Class Codes: G01N 2021/6463 Optics
• CPC Class Codes: G01N 2021/6484 Optical fibres
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G01N 23/2251 using incident electron beams, e.g. scanning electron microscopy [SEM]
• CPC Class Codes: G02B 21/04 involving mirrors
• CPC Class Codes: G02B 21/06 Means for illuminating specimens
• CPC Class Codes: G02B 21/16 adapted for ultraviolet illumination ; Fluorescence microscopes G02B21/0076 takes precedence
• CPC Class Codes: H01J 2237/2806 Secondary charged particle
• CPC Class Codes: H01J 2237/2807 X-rays
• CPC Class Codes: H01J 2237/2808 Cathodoluminescence
• CPC Class Codes: H01J 37/228 whereby illumination or light collection take place in the same area of the discharge
• CPC Class Codes: H01J 37/28 with scanning beams H01J37/268, H01J37/292, H01J37/2955 take precedence

Abstract

Provided is a multiple light source microscope which is capable of performing not only electron image observation but also fluorescence image observation, fluoroscopic image observation and the like for the same biological tissue sample, and is provided with a plurality of observation-use light sources. Disclosed is this multiple light source microscope configured by: an optical microscope unit for observing fluorescence, provided with a light source unit; and a scanning electron microscope unit, wherein the optical microscope has a Cassegrain mirror with an aspherical reflecting surface, and the Cassegrain mirror is arranged in a lens barrel of the scanning microscope unit so as to be coaxial with an optical axis of an electron beam of the scanning electron microscope unit.

Claims

1. A multiple light source microscope which is capable of observing a sample at the same position, comprises an optical microscope unit for observing fluorescence, provided with a light source unit, and a scanning electron microscope unit, wherein the optical microscope has a Cassegrain mirror with an aspherical reflecting surface, and the Cassegrain mirror is arranged in a lens barrel of the scanning microscope unit so as to be coaxial with an optical axis of an electron beam of the scanning electron microscope unit.

2. The multiple light source microscope according to claim 1, wherein the Cassegrain mirror comprises a large mirror having an opening in the center and a small mirror disposed below the opening so as to face the large mirror, and wherein the reflective surfaces of the large mirror and the small mirror are aspherical surfaces.

3. The multiple light source microscope according to claim 1, wherein the light source unit of the optical microscope comprises a plurality of monochromatic light sources and a light synthesizing means to produce a synthetic light by mixing lights from the plurality of monochromatic light sources.

4. The multiple light source microscope according to claim 1, wherein the optical microscope comprises an illumination unit for irradiating a light from the light source unit, an observation camera for observing a return light from the sample, an optical fiber unit for collecting a fluorescence from the sample, and a light path switching mechanism for switching optical path of the return light from the sample to either one of the optical fiber side or the observation camera side.

5. A multiple light source microscope which is capable of observing a sample at the same position, comprises at least a light source unit comprising an electron gun, one or more laser light source and X-ray source which are arranged so as to be movable in the optical axis position, an optical system for irradiating a sample with electromagnetic waves or electron beams from the light source unit, and a detection unit having a fluorescent screen comprising cerium-doped YAG and used for detecting an electromagnetic wave or electron beam transmitted through the sample.

6. The multiple light source microscope according to claim 5, wherein the light source unit comprises a plurality of laser beam sources and a light synthesizing means to produce a synthetic light by mixing lights from the plurality of laser beam sources.