Scanning Microscope, and Method for Light Microscopy Imaging of a Specimen

• US 20130335818A1
• Filed: 02/20/2012
• Published: 12/19/2013
• Est. Priority Date: 02/21/2011
• Status: Active Grant

• Current Assignee: Leica Microsystems Gmbh (Danaher Corporation)
• Original Assignee: Leica Microsystems Gmbh (Danaher Corporation)
• Inventors: Knebel, Werner, Giske, Arnold
• Granted Patent: US 9,030,734 B2
• Time in Patent Office: Days
• US Class Current: 359/385
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G02B 21/0032 Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06
• CPC Class Codes: G02B 21/006 focusing arrangements; selection of the plane to be imaged
• CPC Class Codes: G02B 21/0076 arrangements using fluorescence or luminescence
• CPC Class Codes: G02B 21/06 Means for illuminating specimens

Abstract

A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.

Claims

1. A scanning microscope having

an illumination unit for emitting an illumination light beam,

an objective for generating an elongated illumination focus in a specimen to be imaged, and

a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective,

wherein the scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis (O) of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.

2. The scanning microscope according to claim 1, wherein the scanning apparatus modifies the direction of incidence of the illumination light beam in order to generate a light sheet, formed by the moving illumination focus, within a plane of incidence that is offset parallel to the optical axis (O) of the objective.

3. The scanning microscope according to claim 2, wherein the sub-region of the entrance pupil through which the illumination light beam passes occupies approximately 0.1% to 50% of the total area of the entrance pupil, and

the parallel offset of the plane of incidence with respect to the optical axis (O) of the object is equal to approximately 4 to 96% of the radius of the entrance pupil.

4. The scanning microscope according to claim 2, wherein the scanning apparatus comprises an optical offsetting element, arranged in the light path of the illumination light beam between the illumination unit and the objective, with which the plane of incidence of the illumination light beam is offset parallel to the optical axis (O) of the objective.

5. The scanning microscope according to claim 4, wherein the optical offsetting element is of wedge-shaped configuration.

6. The scanning microscope according to claim 4, wherein the scanning apparatus comprises a positioning element for introducing the optical offsetting element into and removing it from the light path of the illumination light beam.

7. The scanning microscope according to claim 1, wherein

the scanning apparatus comprises at least one movable mirror that reflects the illumination light beam emitted from the illumination unit into the sub-region of the entrance pupil offset from the pupil center, and

comprises a drive with which the mirror is movable in order to modify the direction of incidence of the illumination light beam.

8. The scanning microscope according to claim 7, wherein the mirror of the scanning apparatus is arranged at an offset with respect to the optical axis (O) of the objective.

9. The scanning microscope according to claim 1, wherein the scanning apparatus comprises an optical beam adjusting element, arranged in the light path of the illumination light beam between the illumination unit and the objective, for modifying the beam diameter of the illumination light beam emitted from the illumination unit.

10. The scanning microscope according to claim 1, wherein the illumination light beam is assembled from an excitation light beam and a deexcitation light beam that are superimposed onto one another before entering the scanning apparatus;

and the objective generates an excitation focus from the excitation light beam and a deexcitation focus from the deexcitation light beam, which are superimposed onto one another to yield the illumination focus.

11. The scanning microscope according to claim 10, wherein the deexcitation focus has a spatial light intensity distribution that has a minimum in a plane in which the illumination focus assembled from the excitation focus and the deexcitation focus is moved in order to generate a light sheet, and a respective maximum on either side of that plane.

12. The scanning microscope according to claim 11, characterized by a phase plate, arranged in the light path of the deexcitation light beam, for adjusting the spatial intensity distribution of the deexcitation focus superimposed on the excitation focus.

13. The scanning microscope according to claim 1, characterized by an element for varying the intensity of the illumination light beam within a scanning period during which the illumination focus is moved over the target region.

14. The scanning microscope according to claim 1, characterized by a detection optic having a first sub-optic for intermediate imaging of an image, arranged at an inclination to the optical axis (O′

) of the first sub-optic and generated by the objective, of the target region illuminated by the inclined illumination focus; and

a second sub-optic for imaging the intermediate image, generated by the first sub-optic, onto a detection surface that is arranged parallel to the intermediate image.

15. A method for light microscopy imaging of a specimen, having the following steps:

emitting an illumination light beam,

generating an elongated illumination focus in the specimen to be imaged by means of an objective,

moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective,

wherein the illumination light beam is directed onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis (O) of the objective, and the direction of incidence of the illumination light beam is modified within that sub-region in order to move the illumination focus over the target region to be illuminated.

16. The method according to claim 15, wherein the direction of incidence of the illumination light beam is modified within a plane of incidence that is offset parallel to the optical axis (O) of the objective in order to generate a light sheet formed by the moving illumination focus.

17. The method according to claim 15, wherein the illumination light beam is assembled from an excitation light beam and a deexcitation light beam;

and an excitation focus is generated from the excitation light beam and a deexcitation focus is generated from the deexcitation light beam, which are superimposed on one another to yield the illumination focus.

18. The method according to claim 17, wherein the spatial intensity distribution of the deexcitation focus is adjusted in such a way that it has a minimum in a plane in which the illumination focus assembled from the excitation focus and the deexcitation focus is moved in order to generate a light sheet, and a respective maximum on either side of that plane.

19. The method according to claim 15, wherein the intensity of the illumination light beam is varied within a scanning period during which the illumination focus is moved over the target region.

20. The method according to claim 19, wherein the excitation light beam and/or the deexcitation light beam are alternatingly switched in and out.