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Low-Power Capacitive Sensor Monitoring and Method

  • US 20140002406A1
  • Filed: 06/28/2012
  • Published: 01/02/2014
  • Est. Priority Date: 06/28/2012
  • Status: Abandoned Application
First Claim
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1. A touch screen controller system for controlling a touch screen having a first number of first type conductors and a second number of second type conductors, comprising:

  • (a) analog-digital circuitry coupled to the first type conductors and the second type conductors of a touch screen for producing a first digital signal representative of a self capacitance of one of the second type conductors during an element proximity scanning mode and also representative of mutual capacitances of the touch screen during an element location scanning mode, the analog-digital circuitry operating to superimpose charge transfers from mutual capacitances of one of the first type conductors to one of the second type conductors during the element location scanning mode, and also operating to produce information representative of the influence of an element on the self-capacitance during the element proximity scanning mode;

    (b) calibration circuitry coupled to receive the first digital signal for calibrating the first digital signal with respect to base line data representing neutral values of the self capacitances during the element proximity scanning mode and for calibrating the first digital signal with respect to base line data representing neutral values of the mutual capacitances during the element location scanning mode to produce a second digital signal which may represent either element proximity induced self-capacitance change values during the element proximity scanning mode or element location induced mutual capacitance change values during the element location scanning mode;

    (c) touch presence monitoring circuitry for operating on the second digital signal during the element proximity scanning mode to determine if the element is proximate to the touch screen; and

    (d) a processing circuit for operating on the second digital signal during the element location scanning mode to produce a third digital signal which represents a magnitude map of element induced mutual capacitance change values.

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