REAL-TIME 3D SHAPE MEASUREMENT SYSTEM
First Claim
1. A computer-implemented method for performing three-dimensional shape inspection, comprising:
- generating a pseudorandom sequence of values;
constructing, from the pseudorandom sequence of values, a pattern of light comprised of a plurality of symbols, where each type of symbol in the pattern of light having a different geometric shape and encoding a different value in the pseudorandom sequence of values;
projecting the pattern of light from a light projector onto an object of interest, where the pattern of light is projected along an epipolar line defined by an intersection of an epipolar plane with an image plane of the light projector;
capturing image data indicative of the object using an imaging device; and
determining a measure for the object from the image data and the pattern of light projected onto the object.
1 Assignment
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Accused Products
Abstract
Improved method and system for performing three-dimensional shape inspection by: projecting a pattern of light onto an object of interest with a projector, the pattern of light being constituted by a plurality of symbols of different shapes; capturing an image of the illuminated object with an image capturing device; determining the 3D shape of the object from the image data and the projected light pattern with a processor using triangulation. The pattern of light is projected in an omnidirectional plane by means of a first mirrored surface having hyperbolic shape to provide an alternative to traditional monochromatic light based patterns.
36 Citations
36 Claims
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1. A computer-implemented method for performing three-dimensional shape inspection, comprising:
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generating a pseudorandom sequence of values; constructing, from the pseudorandom sequence of values, a pattern of light comprised of a plurality of symbols, where each type of symbol in the pattern of light having a different geometric shape and encoding a different value in the pseudorandom sequence of values; projecting the pattern of light from a light projector onto an object of interest, where the pattern of light is projected along an epipolar line defined by an intersection of an epipolar plane with an image plane of the light projector; capturing image data indicative of the object using an imaging device; and determining a measure for the object from the image data and the pattern of light projected onto the object. - View Dependent Claims (2, 3, 4, 5, 6, 7, 11)
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8. A computer-implemented method for performing three-dimensional shape inspection, comprising:
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projecting the pattern of light from a light projector onto an object of interest, wherein the pattern of light is comprised of a plurality of symbols having different geometric shapes and is projected along an epipolar line defined by an intersection of an epipolar plane with an image plane of the light projector; capturing image data indicative of the object using an imaging device, where a scan line in the image data is aligned with an epipolar line defined by an intersection of an epipolar plane with an image plane of the imaging device; determining position of a given symbol in the image data and position of the given symbol in the pattern of light projected onto the object; and determining a measurement for the object using triangulation between the position of the given symbol in the image data and its corresponding position in the pattern of light. - View Dependent Claims (9, 10)
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12. A non-contact inspection system for real-time three-dimensional shape inspection, comprising:
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a projector operable to project a pattern of light onto an object of interest, wherein the pattern of light is comprised of a plurality of symbols and is projected along an epipolar line defined by an intersection of an epipolar plane with an image plane of the light projector, such that each type of symbol in the pattern of light has a different geometric shape and encodes a value from a pseudorandom sequence of values; an imaging device configured to capture image data indicative of the object, where a scan line in the image data is aligned with an epipolar line defined by an intersection of an epipolar plane with an image plane of the imaging device; and an image processor configured to receive the image data from the imaging device and operable to determine a measure for the object from the image data by using the pattern of light projected onto the object. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
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20. An automated method for performing three-dimensional shape inspection, comprising:
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projecting a pattern of light from a light projector onto an object of interest, wherein the pattern of light is comprised of a plurality of symbols having different geometric shapes and projected in an omnidirectional plane about the projector; capturing image data indicative of the object using an imaging device; determining position of a given symbol in the image data, where the given symbol is one of the plurality of symbols; determining position of the given symbol in the pattern of light projected onto the object; and determining a measurement for the object using triangulation between the position of the given symbol in the image data and its corresponding position in the pattern of light. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29)
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30. A non-contact inspection system for real-time three-dimensional shape inspection, comprising:
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a projector operable to project a pattern of light in a projected direction towards an image plane and onto a first mirrored surface having a hyperbolic shape, such that the pattern of light is projected as omnidirectional ring about the projector; an imaging device disposed adjacent to the projector and having an image plane arranged in parallel with the image plane of the projector, wherein the imaging device is configured to capture image data reflected from a second mirrored surface having a hyperbolic shape, such that the second mirrored surface is facing towards the first mirrored surface; and an image processor configured to receive the image data from the imaging device and operable to determine a measure for an object from the image data by using the pattern of light projected by the projector. - View Dependent Claims (31, 32, 33, 34, 35, 36)
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Specification