METHODS AND SYSTEMS FOR CHARACTERIZING AND IDENTIFYING ELECTRONIC DEVICES
First Claim
1. A method for characterizing an electronic device, comprising:
- determining a physical fingerprint of an electronic device comprising a static random access memory (SRAM) array, using selected memory cells of the SRAM array, wherein the physical fingerprint comprises data retention voltages respectively corresponding to the selected memory cells; and
storing data associated with the physical fingerprint in a database.
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0 Petitions
Accused Products
Abstract
The present disclosure provides a method and a system for characterizing and identifying an electronic device using a physical fingerprint. In one aspect, the characterizing method includes determining the physical fingerprint of a test device using selected memory cells of an SRAM array in the test device, and storing data associated with the physical fingerprint in a database. The physical fingerprint of the test device includes data retention voltages respectfully corresponding to the selected memory cells. In one aspect, the identifying method includes characterizing a test device using data retention voltages of selected memory cells in the test device as a physical fingerprint of the test device, and comparing the physical fingerprint of the test device with a predetermined fingerprint of a target device.
9 Citations
42 Claims
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1. A method for characterizing an electronic device, comprising:
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determining a physical fingerprint of an electronic device comprising a static random access memory (SRAM) array, using selected memory cells of the SRAM array, wherein the physical fingerprint comprises data retention voltages respectively corresponding to the selected memory cells; and storing data associated with the physical fingerprint in a database. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 41)
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15. A method for identifying an electronic device, comprising:
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characterizing a test device comprising a static random access memory (SRAM) array, wherein selected memory cells of the SRAM array respectfully comprises data retention voltages corresponding to a physical fingerprint of the test device; and comparing the physical fingerprint with a predetermined fingerprint stored in a database to determine whether the physical fingerprint and the predetermined fingerprint are within-class or between-class, wherein the predetermined fingerprint is associated with a target device to be identified. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A system for characterizing an electronic device, comprising:
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a processor; memory coupled to the processor for storing a database; and a measurement subsystem configured to; determine a physical fingerprint of an electronic device comprising a static random access memory (SRAM) array, using selected memory cells of the SRAM array, wherein the physical fingerprint comprises data retention voltages respectfully corresponding to the selected memory cells; and storing data associated with the physical fingerprint in the database. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32, 42)
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33. A system for identifying an electronic device, comprising:
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a processor; memory coupled to the processor for storing a database; a measurement subsystem configured to characterizing a test device comprising a static random access memory (SRAM) array, wherein selected memory cells of the SRAM array respectfully comprises data retention voltages corresponding to a physical fingerprint of the test device; and an analysis subsystem configured to compare the physical fingerprint with a predetermined fingerprint stored in the database to determine whether the physical fingerprint and the predetermined fingerprint are within-class or between-class, wherein the predetermined fingerprint is associated with a target device to be identified. - View Dependent Claims (34, 35, 36, 37, 38, 39, 40)
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Specification