BIG DATA ANALYTICS SYSTEM

• US 20140006338A1
• Filed: 06/27/2013
• Published: 01/02/2014
• Est. Priority Date: 06/29/2012
• Status: Abandoned Application

• Current Assignee: Applied Materials Incorporated
• Original Assignee: Applied Materials Incorporated
• Inventors: Moyne, James, Watson, Scott, Samantaray, Jamini, Scoville, John
• Application Number:
  US13/929,615
• Publication Number:
  US 20140006338A1
• Time in Patent Office: Days
• US Class Current: 707/602
• CPC Class Codes: G06F 16/254 Extract, transform and load [ETL] procedures, e.g. ETL data flows in data warehouses

Abstract

A big data analytics system obtains a plurality of manufacturing parameters associated with a manufacturing facility. The big data analytics system identifies first real-time data from a plurality of data sources to store in memory-resident storage based on the plurality of manufacturing parameters. The plurality of data sources are associated with the manufacturing facility. The big data analytics system obtains second real-time data from the plurality of data sources to store in distributed storage based on the plurality of manufacturing parameters.

Claims

1. A method comprising:

obtaining a plurality of manufacturing parameters associated with a manufacturing facility;

identifying, by a computing system comprising a processing device, first real-time data from a plurality of data sources to store in memory-resident storage based on the plurality of manufacturing parameters, wherein the plurality of data sources are associated with the manufacturing facility; and

identifying, by the computing system, second real-time data from the plurality of data sources to store in distributed storage based on the plurality of manufacturing parameters.

2. The method of claim 1, wherein the plurality of manufacturing parameters are associated with an event, and further comprising:

obtaining a subset of the first real-time data from the memory-resident storage upon the occurrence of the event;

determining whether additional data is needed to analyze the event; and

obtaining the additional data upon determining that the additional data is needed to analyze the event, wherein the additional data is obtained from the memory-resident storage if the additional data is stored in the memory-resident storage, and wherein the additional data is obtained from the distributed storage if the additional data is not stored in the memory-resident storage.

3. The method of claim 1, further comprising:

creating a graphical representation for the first real-time data based on the plurality of manufacturing parameters; and

storing the graphical representation for the first real-time data in the memory-resident storage.

4. The method of claim 1, wherein the memory-resident storage comprises an in-memory database.

5. The method of claim 1, wherein the distributed storage comprises a plurality of distributed databases.

6. The method of claim 1, wherein identifying the first real-time data to store to memory-resident storage comprises:

applying one or more of the plurality of manufacturing parameters to a real-time data stream from at least one of the plurality of data sources;

determining whether a portion of the real-time data stream matches the one or more of the plurality of manufacturing parameters; and

selecting the portion of the real-time data stream as the first real-time data upon determining that the portion of the real-time data stream matches the one or more of the plurality of manufacturing parameters.

7. The method of claim 1, further comprising:

determining whether an additional event has occurred based on a search of the memory-resident storage for a plurality of additional manufacturing parameters associated with the additional event; and

upon determining that the additional event has not occurred based on the search of the memory-resident storage, determining whether the additional event has occurred based on a search of the distributed storage for the plurality of additional manufacturing parameters associated with the additional event.

8. A non-transitory computer-readable storage medium having instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

obtaining a plurality of manufacturing parameters associated with a manufacturing facility;

identifying, by the processing device, first real-time data from a plurality of data sources to store in memory-resident storage based on the plurality of manufacturing parameters, wherein the plurality of data sources are associated with the manufacturing facility; and

identifying, by the processing device, second real-time data from the plurality of data sources to store in distributed storage based on the plurality of manufacturing parameters.

9. The non-transitory computer-readable storage medium of claim 8, wherein the plurality of manufacturing parameters are associated with an event, and wherein the processing device is to perform operations further comprising:

obtaining a subset of the first real-time data from the memory-resident storage upon the occurrence of the event;

determining whether additional data is needed to analyze the event; and

obtaining the additional data upon determining that the additional data is needed to analyze the event, wherein the additional data is obtained from the memory-resident storage if the additional data is stored in the memory-resident storage, and wherein the additional data is obtained from the distributed storage if the additional data is not stored in the memory-resident storage.

10. The non-transitory computer-readable storage medium of claim 8, wherein the processing device is to perform operations further comprising:

creating a graphical representation for the first real-time data based on the plurality of manufacturing parameters; and

storing the graphical representation for the first real-time data in the memory-resident storage.

11. The non-transitory computer-readable storage medium of claim 8, wherein the memory-resident storage comprises an in-memory database.

12. The non-transitory computer-readable storage medium of claim 8, wherein to identify the first real-time data to store to memory-resident storage, the processing device is to perform operations comprising:

applying one or more of the plurality of manufacturing parameters to a real-time data stream from at least one of the plurality of data sources;

determining whether a portion of the real-time data stream matches the one or more of the plurality of manufacturing parameters; and

selecting the portion of the real-time data stream as the first real-time data upon determining that the portion of the real-time data stream matches the one or more of the plurality of manufacturing parameters.

13. The non-transitory computer-readable storage medium of claim 8, wherein the processing device is to perform operations further comprising:

determining whether an additional event has occurred based on a search of the memory-resident storage for a plurality of additional manufacturing parameters associated with the additional event; and

upon determining that the additional event has not occurred based on the search of the memory-resident storage, determining whether the additional event has occurred based on a search of the distributed storage for the plurality of additional manufacturing parameters associated with the additional event.

14. A system comprising:

a memory; and

a processing device coupled to the memory, wherein the processing device is to;

obtain a plurality of manufacturing parameters associated with a manufacturing facility;

identify first real-time data from a plurality of data sources to store in memory-resident storage based on the plurality of manufacturing parameters, wherein the plurality of data sources are associated with the manufacturing facility; and

identify second real-time data from the plurality of data sources to store in distributed storage based on the plurality of manufacturing parameters.

15. The system of claim 14, wherein the plurality of manufacturing parameters are associated with an event, and wherein the processing device is further to:

obtain a subset of the first real-time data from the memory-resident storage upon the occurrence of the event;

determine whether additional data is needed to analyze the event; and

obtain the additional data upon determining that the additional data is needed to analyze the event, wherein the additional data is obtained from the memory-resident storage if the additional data is stored in the memory-resident storage, and wherein the additional data is obtained from the distributed storage if the additional data is not stored in the memory-resident storage.

16. The system of claim 14, wherein the processing device is further to:

create a graphical representation for the first real-time data based on the plurality of manufacturing parameters; and

store the graphical representation for the first real-time data in the memory-resident storage.

17. The system of claim 14, wherein the memory comprises the memory-resident storage, and wherein the memory-resident storage comprises an in-memory database.

18. The system of claim 14, wherein the distributed storage comprises a plurality of distributed databases.

19. The system of claim 14, wherein to identify the first real-time data to store to memory-resident storage, the processing device is to:

apply one or more of the plurality of manufacturing parameters to a real-time data stream from at least one of the plurality of data sources;

determine whether a portion of the real-time data stream matches the one or more of the plurality of manufacturing parameters; and

select the portion of the real-time data stream as the first real-time data upon determining that the portion of the real-time data stream matches the one or more of the plurality of manufacturing parameters.

20. The system of claim 14, wherein the processing device is further to:

determine whether an additional event has occurred based on a search of the memory-resident storage for a plurality of additional manufacturing parameters associated with the additional event; and

upon determining that the additional event has not occurred based on the search of the memory-resident storage, determine whether the additional event has occurred based on a search of the distributed storage for the plurality of additional manufacturing parameters associated with the additional event.