IC LAYOUT PATTERN MATCHING AND CLASSIFICATION SYSTEM AND METHOD
First Claim
1. A method for classifying patterns in a set of layout patterns, comprising:
- computing a plurality of moments for each of a plurality of pattern windows of an integrated circuit layout; and
classifying the pattern windows into pattern classes using a distance computation for respective moments of the pattern windows.
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Abstract
A system and method for restricting the number of layout patterns by pattern identification, matching and classification, includes decomposing the pattern windows into a low frequency component and a high frequency component using a wavelet analysis for an integrated circuit layout having a plurality of pattern windows. Using the low frequency component as an approximation, a plurality of moments is computed for each pattern window. The pattern windows are classified using a distance computation for respective moments of the pattern windows by comparing the distance computation to an error value to determine similarities between the pattern windows.
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Citations
23 Claims
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1. A method for classifying patterns in a set of layout patterns, comprising:
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computing a plurality of moments for each of a plurality of pattern windows of an integrated circuit layout; and classifying the pattern windows into pattern classes using a distance computation for respective moments of the pattern windows. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method for classifying patterns in a set of layout patterns, comprising:
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computing a plurality of moments for each of a plurality of pattern windows of an integrated circuit layout using a low frequency component of a wavelet analysis as an approximation; and classifying the pattern windows into pattern classes using a distance computation for respective moments of the pattern windows by comparing the distance computation to an error value to determine similarities between the pattern windows. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21, 22, 23)
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Specification