REDUCING SOURCE LOADING EFFECT IN SPIN TORQUE TRANSFER MAGNETORESISTIVE RANDOM ACCESS MEMORY (STT-MRAM)
First Claim
1. An apparatus comprising:
- a memory cell comprising;
a magnetic tunnel junction (MTJ) structure including;
a free layer coupled to a bit line; and
a pinned layer, wherein a magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state,wherein the pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line.
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Accused Products
Abstract
A memory cell comprises a magnetic tunnel junction (MTJ) structure that includes a free layer coupled to a bit line and a pinned layer. A magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state. The pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line.
10 Citations
21 Claims
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1. An apparatus comprising:
a memory cell comprising; a magnetic tunnel junction (MTJ) structure including; a free layer coupled to a bit line; and a pinned layer, wherein a magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state, wherein the pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line. - View Dependent Claims (2, 3, 4, 5, 6)
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7. An apparatus comprising:
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means for storing a data value as an orientation of a magnetic moment that is programmable by a spin polarized current exceeding a threshold current density, the means for storing the data value coupled to a bit line; and means for storing a pinned magnetic moment having a pinned orientation, wherein the magnetic moment that is programmable is substantially parallel to the pinned magnetic moment in a first state and substantially antiparallel to the pinned magnetic moment in a second state, wherein the means for storing the pinned magnetic moment has a physical dimension to produce an offset magnetic field corresponding to a first switching current to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line. - View Dependent Claims (8, 9)
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10. An apparatus comprising:
a memory device comprising; a plurality of memory cells, wherein at least one memory cell of the plurality of memory cells comprises; a magnetic tunnel junction (MTJ) structure, wherein a magnetic moment of a free layer of the MTJ structure is substantially parallel to a magnetic moment of a pinned layer of the MTJ structure in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state; and an access transistor coupled to the MTJ structure, wherein a ratio of a magnitude of a first switching current to switch the MTJ structure from the first state to the second state is less than half of a second switching current to switch the MTJ structure from the second state to the first state. - View Dependent Claims (11, 12)
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13. A method comprising:
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receiving design information representing at least one physical property of a semiconductor device, the semiconductor device including a magnetic tunnel junction (MTJ) structure including; a free layer coupled to a bit line; and a pinned layer, wherein a magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state, wherein the pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line; transforming the design information to comply with a file format; and generating a data file including the transformed design information. - View Dependent Claims (14)
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15. A method comprising:
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receiving a data file including design information corresponding to a semiconductor device; and fabricating the semiconductor device according to the design information, wherein the semiconductor device includes a magnetic tunnel junction (MTJ) structure including; a free layer coupled to a bit line; and a pinned layer, wherein a magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state, wherein the pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line. - View Dependent Claims (16)
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17. A method comprising:
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receiving design information including physical positioning information of a packaged semiconductor device on a circuit board, the packaged semiconductor device including a semiconductor structure comprising a magnetic tunnel junction (MTJ) structure including; a free layer coupled to a bit line; and a pinned layer, wherein a magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state, wherein the pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line; and transforming the design information to generate a data file. - View Dependent Claims (18)
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19. A method comprising:
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receiving a data file including design information including physical positioning information of a packaged semiconductor device on a circuit board; and manufacturing the circuit board configured to receive the packaged semiconductor device according to the design information, wherein the packaged semiconductor device comprises a magnetic tunnel junction (MTJ) structure including; a free layer coupled to a bit line; and a pinned layer, wherein a magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state, wherein the pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line. - View Dependent Claims (20, 21)
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Specification