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REDUCING SOURCE LOADING EFFECT IN SPIN TORQUE TRANSFER MAGNETORESISTIVE RANDOM ACCESS MEMORY (STT-MRAM)

  • US 20140015077A1
  • Filed: 09/16/2013
  • Published: 01/16/2014
  • Est. Priority Date: 03/02/2009
  • Status: Active Grant
First Claim
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1. An apparatus comprising:

  • a memory cell comprising;

    a magnetic tunnel junction (MTJ) structure including;

    a free layer coupled to a bit line; and

    a pinned layer, wherein a magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state,wherein the pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line.

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