MULTI-AXIS ATOMIC INERTIAL SENSOR SYSTEM

• US 20140016118A1
• Filed: 10/26/2012
• Published: 01/16/2014
• Est. Priority Date: 07/12/2012
• Status: Active Grant

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Compton, Robert, Mohr, Benjamin, Cirillo, Nicholas C. Jr.
• Granted Patent: US 8,860,933 B2
• Time in Patent Office: Days
• US Class Current: 356/72
• CPC Class Codes: G01C 19/58 Turn-sensitive devices without moving masses
• CPC Class Codes: G01C 21/166 Mechanical, construction or arrangement details of inertial navigation systems
• CPC Class Codes: G01C 21/183 Compensation of inertial measurements, e.g. for temperature effects
• CPC Class Codes: G01N 21/00 Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light G01N3/00 - G01N19/00 take precedence
• CPC Class Codes: G01N 21/64 Fluorescence; Phosphorescence
• CPC Class Codes: G01P 15/08 with conversion into electric or magnetic values
• CPC Class Codes: G01P 15/18 in two or more dimensions
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

An inertial sensing system comprises a first multi-axis atomic inertial sensor, a second multi-axis atomic inertial sensor, and an optical multiplexer optically coupled to the first and second multi-axis atomic inertial sensors. The optical multiplexer is configured to sequentially direct light along different axes of the first and second multi-axis atomic inertial sensors. A plurality of micro-electrical-mechanical systems (MEMS) inertial sensors is in operative communication with the first and second multi-axis atomic inertial sensors. Output signals from the first and second multi-axis atomic inertial sensors aid in correcting errors produced by the MEMS inertial sensors by sequentially updating output signals from the MEMS inertial sensors.

Claims

1. An inertial sensing system, comprising:

a first multi-axis atomic inertial sensor;

a second multi-axis atomic inertial sensor;

an optical multiplexer optically coupled to the first and second multi-axis atomic inertial sensors, the optical multiplexer configured to sequentially direct light along different axes of the first and second multi-axis atomic inertial sensors; and

a plurality of micro-electrical-mechanical systems (MEMS) inertial sensors in operative communication with the first and second multi-axis atomic inertial sensors;

wherein output signals from the first and second multi-axis atomic inertial sensors aid in correcting errors produced by the MEMS inertial sensors by sequentially updating output signals from the MEMS inertial sensors.

2. The system of claim 1, wherein the first multi-axis atomic inertial sensor is configured to detect acceleration and rotation.

3. The system of claim 2, wherein the second multi-axis atomic inertial sensor is configured to detect acceleration and rotation.

4. The system of claim 2, wherein the second multi-axis atomic inertial sensor is configured to detect only acceleration.

5. The system of claim 1, wherein the MEMS inertial sensors comprise at least one MEMS gyroscope and at least one MEMS accelerometer.

6. The system of claim 1, wherein the MEMS inertial sensors operatively communicate with the first and second multi-axis atomic inertial sensors through a closed loop feedback.

7. The system of claim 5, further comprising a first atomic inertial sensor compensation unit that receives an output signal from the first multi-axis atomic inertial sensor, wherein the first atomic inertial sensor compensation unit provides sensor corrections based on a factory calibration.

8. The system of claim 7, further comprising a second atomic inertial sensor compensation unit that receives an output signal from the second multi-axis atomic inertial sensor, wherein the second atomic inertial sensor compensation unit provides sensor corrections based on a factory calibration.

9. The system of claim 8, further comprising a MEMS gyroscope compensation unit that receives an output signal from the MEMS gyroscope, wherein the MEMS gyroscope compensation unit aids in correcting errors produced by the MEMS gyroscope.

10. The system of claim 9, further comprising an MEMS accelerometer compensation unit that receives an output signal from the MEMS accelerometer, wherein the MEMS accelerometer compensation unit aids in correcting errors produced by the MEMS accelerometer.

11. The system of claim 10, further comprising a fusion filter that receives output signals from each of the first atomic inertial sensor compensation unit, the second atomic inertial sensor compensation unit, the MEMS gyroscope compensation unit, and the MEMS accelerometer compensation unit, wherein the fusion filter outputs a feedback signal to the MEMS gyroscope compensation unit and the MEMS accelerometer compensation unit to aid in error correction of the MEMS gyroscope and the MEMS accelerometer.

12. The system of claim 1, wherein the system is part of an inertial measurement unit.

13. A multi-axis atomic inertial sensor apparatus, comprising:

a first laser device that outputs a light beam having a first frequency;

a second laser device that outputs a light beam having a second frequency;

an optical multiplexer in optical communication with the first and second laser devices, the optical multiplexer including a plurality of optical switches;

a first multi-axis atomic inertial sensor in optical communication with the optical multiplexer;

a second multi-axis atomic inertial sensor in optical communication with the optical multiplexer;

wherein the optical multiplexer is configured to sequentially direct the light beams from the first and second laser devices along different axes of the first and second multi-axis atomic inertial sensors.

14. The apparatus of claim 13, wherein the first multi-axis atomic inertial sensor is configured to detect acceleration and rotation.

15. The apparatus of claim 14, wherein the second multi-axis atomic inertial sensor is configured to detect acceleration and rotation.

16. The apparatus of claim 14, wherein the second multi-axis atomic inertial sensor is configured to detect only acceleration.

17. The apparatus of claim 13, wherein the optical switches comprise:

a first set of three optical switches configured to sequentially direct the light beams along three different orientation axes of the first multi-axis atomic inertial sensor; and

a second set of three optical switches configured to sequentially direct the light beams along three different orientation axes of the second multi-axis atomic inertial sensor.

18. The apparatus of claim 13, further comprising a plurality of micro-electrical-mechanical system (MEMS) inertial sensors in operative communication with the first and second multi-axis atomic inertial sensors, wherein the MEMS inertial sensors comprise at least one MEMS gyroscope and at least one MEMS accelerometer.

19. The apparatus of claim 18, wherein the apparatus is configured as an optical gimbal sensor.

20. A method for inertial sensing, the method comprising:

providing a first multi-axis atomic inertial sensor and a second multi-axis atomic inertial sensor;

transmitting a pair of laser beams through an optical multiplexer that sequentially directs the laser beams along different axes of the first and second multi-axis atomic inertial sensors; and

outputting signals from the first and second multi-axis atomic inertial sensors to aid in correcting errors produced by one or more micro-electrical-mechanical systems (MEMS) inertial sensors by sequentially updating output signals from the MEMS inertial sensors.