DISCONTINUOUS INTEGRATION USING HALF PERIODS
First Claim
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1. A method comprising:
- monitoring a signal on one or more electrodes of a sense network at a first operating frequency;
monitoring a signal on the one or more electrodes of the sense network at a second operating frequency; and
scanning, by a controller comprising a processing device and a memory, the one or more electrodes to detect a conductive object proximate to the sense network, wherein a constant integration time is used for one half-period when scanning the one or more electrodes at both the first and second operating frequencies.
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Abstract
Apparatuses and methods of frequency hopping algorithms are described. One method monitors a signal on one or more electrodes of a sense network at a first operating frequency and detects noise in the signal at the first operating frequency. The method then switches to a second operating frequency, based on said detecting, for scanning the electrodes to detect a conductive object proximate to the plurality of electrodes, wherein a constant integration time is used for one half-period when scanning the electrodes at both the first and second operating frequencies.
49 Citations
20 Claims
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1. A method comprising:
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monitoring a signal on one or more electrodes of a sense network at a first operating frequency; monitoring a signal on the one or more electrodes of the sense network at a second operating frequency; and scanning, by a controller comprising a processing device and a memory, the one or more electrodes to detect a conductive object proximate to the sense network, wherein a constant integration time is used for one half-period when scanning the one or more electrodes at both the first and second operating frequencies. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A capacitance sensing system comprising:
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a memory device storing calibration data; and a controller coupled to the memory device, wherein the controller is configured to receive signals from a sense network comprising a plurality of electrodes to detect a conductive object proximate to the plurality of electrodes, wherein the controller comprises; a noise listening circuit configured to monitor the plurality of electrodes during a first mode of operation and during a second mode of operation; and a sense control circuit configured to scan the plurality of electrodes to detect the conductive object, wherein the controller uses a same calibration data when operating at both the first and second modes of operation. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A host device comprising:
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a display; a capacitance sensing array disposed in connection with the display; a touchscreen controller coupled to the capacitance sensing array, wherein the touchscreen controller comprises; a capacitance sensing circuit coupled to the capacitance sensing array; and a noise listening circuit coupled to the capacitance sensing array, wherein the noise listening circuit is configured to detect noise on the capacitance sensing circuit from at least one noise source at a first operating frequencies, wherein the touchscreen controller is configured to switch to a second operating frequency in response to detecting the noise, wherein a constant integration time is used for one half-period when scanning the capacitance sense array at both the first and second operating frequencies. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification