Nondestructive Inspection Techniques for Rotorcraft Composites

• US 20140022380A1
• Filed: 07/19/2013
• Published: 01/23/2014
• Est. Priority Date: 07/19/2012
• Status: Active Application

• Current Assignee: Textron Innovations Incorporated (Textron Inc)
• Original Assignee: Bell Helicopter Textron Incorporated (Textron Inc)
• Inventors: Nissen, Jeffrey P., Hohman, Edward, Barry, Robert J.
• Application Number:
  US13/946,805
• Publication Number:
  US 20140022380A1
• Time in Patent Office: Days
• US Class Current: 348/125
• CPC Class Codes: G01N 25/72 Investigating presence of flaws
• CPC Class Codes: G06T 2207/10048 Infrared image
• CPC Class Codes: G06T 2207/30164 Workpiece; Machine component
• CPC Class Codes: G06T 7/0004 Industrial image inspection
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

A field deployable infrared imaging (FDIR) system for inspecting a composite component comprises an emitter configured to impart heat into a composite component via infrared radiation, a camera configured to capture an infrared image of the composite component, and a processing system configured to post-process the infrared image. A method of inspecting a composite component is disclosed that comprises subjecting a component to infrared radiation, capturing a thermal image of the component, inspecting the captured thermal image for defects in the composite component, and post-processing the thermal image using a second order derivative algorithm wherein the post-processed thermal image shows the defect better than the captured infrared image.

Claims

1. An apparatus, comprising:

an infrared camera configured to capture an infrared image of a composite component; and

a processing system coupled to the camera, wherein the processing system is configured to process the captured infrared image and determine whether a defect exists within the composite component.

2. The apparatus of claim 1, further comprising a user interface coupled to the processing system and configured to process the captured infrared image on a pixel-by-pixel basis and produce a processed image, wherein the processed image shows the defect better than the captured infrared image.

3. The apparatus of claim 2, wherein the processing system is configured to enhance the contrast of the captured infrared image using at least one of a first order derivative algorithm and a second order derivative algorithm.

4. The apparatus of claim 2, further comprising input and output devices coupled to the processing system and configured to communicate with an external device to transfer the captured infrared image, the processed image, or both.

5. The apparatus of claim 2, further comprising an environmental sensor coupled to the processing system and configured to detect an environmental factor and associate the environmental factor with the captured infrared image.

6. The apparatus of claim 2, further comprising location position sensing devices coupled to the processing system and configured to provide location based data.

7. The apparatus of claim 1, further comprising an emitter configured to emit infrared radiation onto the composite component at a first wavelength range, wherein the infrared camera captures images at a second wavelength range, and wherein the first wavelength range is different from the second wavelength range.

8. The apparatus of claim 7, wherein the first wavelength range comprises a wavelength from about 800 nanometers to about 2,500 nanometers.

9. The apparatus of claim 8, wherein the emitter is configured to emit infrared radiation comprising an intensity of at least about 200 watts per meter squared (W/m²).

10. The apparatus of claim 8, wherein the emitter is physically integrated into the apparatus with the infrared camera and the processing system.

11. The apparatus of claim 8, wherein the second wavelength range comprises a wavelength from about 1,000 nanometers to about 2,000 nanometers.

12. The apparatus of claim 8, wherein the second wavelength range comprises a wavelength from about 3,000 nanometers to about 5,000 nanometers.

13. The apparatus of claim 8, wherein the second wavelength range comprises a wavelength from about 8,000 nanometers to about 12,000 nanometers.

14. The apparatus of claim 1, wherein the composite component is located on an aircraft.

15. An apparatus, comprising:

an infrared camera configured to capture an infrared image of a composite component at a wavelength of at least one of;

a range of about 1,000 to about 2,000 nanometers;

a range of about 3,000 to about 5,000 nanometers; and

a range of about 8,000 to about 12,000 nanometers;

a processing system coupled to the camera, wherein the processing system is configured to process the captured infrared image on a pixel-by-pixel basis and determine whether a defect exists within the composite component; and

a user interface coupled to the processing system and configured to process the captured infrared image on a pixel-by-pixel basis and produce a processed image, wherein the processed image shows the defect better than the captured infrared image.

16. The apparatus of claim 15, wherein the processing system is configured to enhance the contrast of the captured infrared image using a second order derivative algorithm.

17. The apparatus of claim 15, further comprising an emitter configured to emit infrared radiation at a wavelength between about 800 nanometers and about 2,500 nanometers onto the composite component.

18. The apparatus of claim 16, wherein the emitter is configured to emit infrared radiation comprising an intensity of at least about 200 watts per meter squared (W/m²).

19. The apparatus of claim 15, wherein the composite component is located on an aircraft.

20. A method comprising:

subjecting a composite component to infrared radiation;

capturing a thermal image of the composite component;

inspecting the captured thermal image for defects in the composite component; and

post-processing the thermal image using a second order derivative algorithm wherein the post-processed thermal image shows the defect better than the captured infrared image.

21. The method of claim 20, wherein the infrared radiation comprises a first wavelength between about 800 nanometers and about 2,500 nanometers and an intensity of at least about 200 watts per meter squared (W/m²), and wherein the capturing the thermal image comprises capturing the thermal image at a first wavelength of at least one of:

a range of about 1,000 to about 2,000 nanometers;

a range of about 3,000 to about 5,000 nanometers; and

a range of about 8,000 to about 12,000 nanometers.

22. The method of claim 20, further comprising:

applying a high emissive black coating to the composite component prior to subjecting the composite component to infrared radiation.

23. The method of claim 20, wherein the capturing a thermal image of the composite component occurs at an offset angle of at least about 10 degrees from the infrared radiation.

24. The method of claim 20, wherein the composite component is located on an aircraft.