×

TESTING TUNED CIRCUITS

  • US 20140024919A1
  • Filed: 07/19/2012
  • Published: 01/23/2014
  • Est. Priority Date: 07/19/2012
  • Status: Active Grant
First Claim
Patent Images

1. A method of testing an implantable medical device, the implantable medical device including a tuned circuit having a coil for transferring energy between the implantable medical device and another device, the method comprising:

  • inducing an EMF in the coil of the tuned circuit;

    detecting a resonance of the tuned circuit in response to the EMF induced in the coil of the tuned circuit; and

    analysing the detected resonance over a period of time to determine a property of the tuned circuit.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×