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DYNAMIC TEMPERATURE CALIBRATION

  • US 20140025330A1
  • Filed: 07/11/2013
  • Published: 01/23/2014
  • Est. Priority Date: 07/11/2012
  • Status: Abandoned Application
First Claim
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1. A micro-processor, on-chip logic, or software implemented method for processing data from an integrated MEMS device having an inertial sensor and a temperature sensor disposed within a hand-held computer system programmed to perform the method, the method comprising:

  • sensing, by the inertial sensor disposed within the computer system, one or more calibration data measurements;

    sensing, by the temperature sensor disposed within the computer system, one or more temperature data measurements; and

    determining, with a processor disposed within the computer system, computed offset data for the MEMS sensor through a dynamic temperature correction (DTC) process using the calibration data measurements and the temperature data measurements.

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