SENSOR DEVICE
First Claim
1. Method for manufacturing a sensor chip, comprising the steps ofproviding a substrate with a front side and a back side,arranging a sensing element at the front side,arranging a spacer at the front side,etching holes into the substrate, andfilling the holes with a conducting material for building vias extending through the substrate between the front side and the back side,wherein the sensor chip is arranged on a chuck with the spacer facing the chuck for electrically contacting contact pads arranged at the back side with electrodes.
1 Assignment
0 Petitions
Accused Products
Abstract
In a method for manufacturing a sensor chip a spacer (3) is arranged at the front side (11) of a substrate (1) at which front side (11) a sensing element (2) is arranged, too. Holes (14) are etched for building vias (15) extending through the substrate (1) between the front side (11) of the substrate (1) and its back side (12). After etching, the holes (14) are filled with conductive material to complete the vias (15). The spacer (3) provides protection to the sensing element (2) and the sensing chip throughout the manufacturing process.
17 Citations
24 Claims
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1. Method for manufacturing a sensor chip, comprising the steps of
providing a substrate with a front side and a back side, arranging a sensing element at the front side, arranging a spacer at the front side, etching holes into the substrate, and filling the holes with a conducting material for building vias extending through the substrate between the front side and the back side, wherein the sensor chip is arranged on a chuck with the spacer facing the chuck for electrically contacting contact pads arranged at the back side with electrodes.
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3. (canceled)
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5. (canceled)
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13. Testing device for testing a sensor chip, the sensor chip comprising a substrate with a front side and a back side, a sensing element and conductors arranged at the front side, contact pads arranged at the back side, vias extending through the substrate between the front side and the back side for electrically connecting the conductors to the contact pads, and a spacer arranged at the front side for protecting the sensing element, the testing device comprising
a chuck for arranging the sensor chip on with the spacer facing the chuck for electrically contacting contact pads arranged at the back side with electrodes.
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14. Testing device for testing sensor chips provided in form of a wafer, the wafer comprising a front side and a back side, wherein sensing elements and conductors for the multiple sensor chips are arranged at the front side, wherein contact pads are arranged at the back side, wherein vias extend through the wafer between the front side and the back side for electrically connecting the conductors to the contact pads, and wherein spacers are arranged at the front side for protecting the sensing elements, the testing device comprising
a chuck for arranging the wafer on with the spacers facing the chuck for electrically contacting the contact pads arranged at the back side with electrodes.
- 16. (canceled)
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24. (canceled)
Specification