MEMORY TEST METHOD, MEMORY TEST DEVICE, AND ADAPTER THEREOF

• US 20140053032A1
• Filed: 06/06/2013
• Published: 02/20/2014
• Est. Priority Date: 08/15/2012
• Status: Active Grant

• Current Assignee: Wistron Corporation
• Original Assignee: Wistron Corporation
• Inventors: HO, DING-SHIUAN, LO, FU-NEN
• Granted Patent: US 9,032,262 B2
• Time in Patent Office: Days
• US Class Current: 714/718
• CPC Class Codes: G11C 29/08 Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
• CPC Class Codes: G11C 29/56016 Apparatus features
• CPC Class Codes: G11C 5/04 Supports for storage elements , e.g. memory modules; Mounting or fixing of storage elements on such supports

Abstract

A memory test device used to test performance of at least one memory module on an electronic device, are provided. The memory test device includes at least one adapter and a control unit. The adapter includes a plugging portion, a slot, and a switch circuit. The plugging portion is used to be plugged in a memory module slot of the electronic device. The slot is connected electrically to the plugging portion, is used for the memory module to plug in, and is capable of outputting a work voltage to the memory module when the adapter is plugged in the memory module slot and connected electrically to it. The switch circuit is connected electrically to the plugging portion and the slot. The control unit is connected electrically to the switch circuit of each adapter, where the control unit enables or disables the plugged memory module by controlling the switch circuit.

Claims

1. A memory module test device, used to test running performance of at least one memory module on an electronic device to be tested, wherein the electronic device to be tested comprises a circuit board, at least one memory module slot is disposed on the circuit board, and each memory module slot is used for the memory module to plug in, the memory module test device comprising:

at least one adapter, comprising;

a plugging portion, used to be plugged in the memory module slot;

a slot, connected electrically to the plugging portion, used for the memory module to plug in, and capable of outputting a work voltage to the memory module when the adapter is plugged in the memory module slot and connected electrically to the memory module slot; and

a switch circuit, connected electrically to the plugging portion and the slot; and

a control unit, connected electrically to the switch circuit of the adapter, wherein the control unit enables or disables the plugged memory module by controlling the switch circuit.

2. The memory module test device according to claim 1, wherein the control unit is programmable.

3. The memory module test device according to claim 1, wherein the control unit comprises an operation interface, used to set a test operation procedure for the control unit.

4. The memory module test device according to claim 1, wherein the electronic device to be tested further comprises a storage device installed with a memory test program, and the memory test program executes at least one memory test item on the memory module.

5. The memory module test device according to claim 1, wherein the control unit controls the number and/or an order of tested memories of the memories by controlling the switch circuit.

6. The memory module test device according to claim 1, wherein the control unit controls enabling or disabling of each bit of each memory by controlling the switch circuit.

7. The memory module test device according to claim 1, wherein each adapter further comprises a connection port, connected electrically to the switch circuit, and the control unit is connected electrically to the switch circuit through the connection port.

8. The memory module test device according to claim 1, wherein after a test in a memory configuration is completed, the control unit outputs a reset signal to the electronic device to be tested to restart the electronic device to be tested.

9. An adapter, used to adapt a memory module to a memory module slot of an electronic device to be tested, the adapter comprising:

a plugging portion, used to be plugged in the memory module slot;

a slot, connected electrically to the plugging portion, used for the memory module to plug in, and capable of outputting a work voltage to the memory module when the adapter is plugged in the memory module slot and connected electrically to the memory module slot; and

a switch circuit, connected electrically to the plugging portion and the slot,

wherein the switch circuit receives a first control signal to enable or disable the plugged memory module.

10. The adapter according to claim 9, further comprising a connection port, connected electrically to the switch circuit, and the switch circuit receives the first control signal through the connection port.

11. The adapter according to claim 9, wherein the switch circuit further receives a second control signal to control enabling or disabling of each bit of the memory module.

12. The adapter according to claim 11, wherein the first control signal and the second control signal are output by a control unit, and the control unit is connected electrically to a host and the switch circuit.

13. The adapter according to claim 9, wherein the switch circuit is selected from a transistor a relay.

14. A memory module test method, used to test running performance of at least one memory module on an electronic device to be tested, wherein the electronic device to be tested comprises a circuit board, at least one memory module slot is disposed on the circuit board, and each memory module slot is used for the memory module to plug in, the memory module test method comprising:

providing at least one adapter controlled by a control unit, wherein one end of the adapter is used to be plugged in the memory module slot, and the other end of the adapter is used for each memory module to plug in;

plugging the one end of each adapter in each memory module slot;

plugging each memory module in the other end of each adapter;

controlling enabling and disabling of each memory module through the adapter by the control unit; and

executing at least one memory test item on each memory module.

15. The memory module test method according to claim 14, wherein after executing each memory test item completely, the method further comprises:

sending a reset signal to the electronic device to be tested to restart the electronic device to be tested.

16. The memory module test method according to claim 15, wherein the enabling and the disabling of the memory module define a first memory configuration state, and after sending the reset signal, the method further comprises:

each adapter controlling enabling and disabling of each memory module to define a second memory configuration state; and

executing each memory test item on each memory module in an enabling state in the second memory configuration state.

17. The memory module test method according to claim 14, wherein each adapter receives a first control signal sent by the control unit to control enabling or disabling of each memory module.

18. The memory module test method according to claim 14, wherein each adapter receives a second control signal sent by the control unit to control enabling or disabling of each bit of each memory module.

19. The memory module test method according to claim 14, wherein each adapter comprises:

a plugging portion, used to be plugged in the memory slot;

a slot, connected electrically to the plugging portion, used for the memory module to plug in, and capable of outputting a work voltage to the memory when the adapter is plugged in the memory module slot and connected electrically to the memory module slot; and

a switch unit, connected electrically to the plugging portion and the slot, and capable of receiving a control signal sent by the control unit to control enabling and disabling of each memory module or enabling and disabling of each bit of each memory module.