SYSTEMS AND METHODS FOR MEASURING SHEET RESISTANCE
First Claim
1. A display driver integrated circuit (IC) for determining a sheet resistance of a display panel, comprising:
- a first switch coupled to a first input/output (I/O) pad and a second I/O pad, wherein the first I/O pad is configured to couple to a voltage source and the second I/O pad is configured to couple to a current source; and
a second switch coupled to a third I/O pad and the second I/O pad, wherein the second switch has substantially the same geometry as the first switch, and wherein the third I/O pad is configured to couple to a thin-film transistor (TFT) layer of the display panel.
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Accused Products
Abstract
The present disclosure is directed to systems and methods for determining sheet resistance values in a liquid crystal display (LCD) panel. In certain embodiments, a system for determining sheet resistance values in an LCD panel may include a display driver integrated circuit (IC). The display driver IC may include a first switch coupled to a first input/output (I/O) pad and a second I/O pad such that the first I/O pad is configured to couple to a voltage source and the second I/O pad is configured to couple to a current source. The display driver IC may also include a second switch coupled to a third I/O pad and the second I/O pa such that the second switch has substantially the same geometry as the first switch and the third I/O pad is configured to couple to a thin-film transistor (TFT) layer of the display panel.
9 Citations
20 Claims
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1. A display driver integrated circuit (IC) for determining a sheet resistance of a display panel, comprising:
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a first switch coupled to a first input/output (I/O) pad and a second I/O pad, wherein the first I/O pad is configured to couple to a voltage source and the second I/O pad is configured to couple to a current source; and a second switch coupled to a third I/O pad and the second I/O pad, wherein the second switch has substantially the same geometry as the first switch, and wherein the third I/O pad is configured to couple to a thin-film transistor (TFT) layer of the display panel. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A system, comprising:
a display driver integrated circuit (IC), comprising; a first switch coupled to a first input/output (I/O) pad and a second I/O pad, wherein the first I/O pad is coupled to a voltage source, and wherein the second I/O pad is coupled to a current source; and a second switch coupled to a third I/O pad and the second I/O pad, wherein the third I/O pad is coupled to a thin-film transistor (TFT) layer of a liquid crystal display (LCD); and a test circuit, comprising; the current source; and a controller configured to determine a resistance of the TFT layer by controlling the first switch, the second switch, and the current source. - View Dependent Claims (8, 9, 10, 11, 12)
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13. An electronic device, comprising:
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a display comprising a chip-on-glass (COG) circuit and a flex-on-glass circuit (FOG), wherein the display is configured to display image data, and wherein the COG circuit comprises; a first switch coupled to a first COG pad and a second COG pad disposed on the COG circuit, wherein the first COG pad is coupled to a voltage source the second COG pad is coupled to a FOG pad disposed on the FOG circuit; and a second switch coupled to a third COG pad and the second COG pad, wherein the third COG pad is coupled to a thin-film transistor (TFT) layer of the display; and a test circuit comprising a current source, wherein the test circuit is configured to couple the current source to the FOG pad. - View Dependent Claims (14, 15, 16)
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18. A liquid crystal display (LCD), comprising:
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a test circuit comprising a current source; a display driver integrated circuit (IC), comprising; a first switch coupled to a first input/output (I/O) pad and a second I/O pad, wherein the first I/O pad is coupled to a voltage source, and wherein the second I/O pad is coupled to the current source; and a second switch coupled to a third I/O pad and the second I/O pad, wherein the third I/O pad is coupled to a thin-film transistor (TFT) layer of the LCD; and a controller configured to determine a resistance of the TFT layer by; determining a resistance of the first switch based at least in part on a first current provided by the current source, a plurality of voltage values that correspond to when the first switch is closed and the current source is off and when the first switch is closed and the current source is on, and a first current provided by the current source when the first switch is closed and the current source is on; and determining the resistance of the TFT layer based at least in part on the resistance of the first switch, a first voltage at the second I/O pad when the second switch is closed, and a second current provided by the current source. - View Dependent Claims (19)
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20. A method for determining a quality of a display, comprising:
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determining a resistance of a thin-film transistor (TFT) layer of the display by; measuring a first voltage at a first I/O pad when a first switch coupled between the first I/O pad and a voltage source is closed; measuring a second voltage at the first I/O pad when the first switch is closed and a first current is provided to the first switch via a current source; determining a resistance of the first switch based at least in part on the first voltage, the second voltage, and the first current; providing a second current from the current source to the first I/O pad when the first switch is open and a second switch is closed, wherein the second switch is coupled between the first I/O pad and the TFT layer, wherein the second current is configured to bias the second switch such that a resistance of the second switch is substantially the same as the resistance of the first switch; and determining the resistance of the TFT layer based at least in part on the second current and the resistance of the first switch; determining whether the resistance of the TFT layer is within limits; and determining that the display has failed a quality assurance test when the resistance of the TFT layer is not within the limits.
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Specification