SURFACE-EMISSION LASER DIODE AND FABRICATION PROCESS THEREOF
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Abstract
In a surface-emission laser diode, there is provided, between an active layer and a semiconductor layer that contains AI, Ga and As as major components, a semiconductor layer containing AI, In and P as major components such that the semiconductor layer containing AI, In and P as major components is provided adjacent to the semiconductor layer that contains AI, Ga and As as major components. Further, an interface between the semiconductor layer containing AI, Ga and As as major components and the semiconductor layer containing AI, In and P as major components is coincident to a location of a node of electric field strength distribution.
5 Citations
48 Claims
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1-35. -35. (canceled)
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36. A surface-emission laser diode, comprising:
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a GaAs substrate; a cavity region formed over said GaAs substrate, said cavity region including at least one quantum well active layer producing a laser light and barrier layers; and an upper reflector and a lower reflector provided at a top part and a bottom part of said cavity region over said GaAs substrate, said upper reflector and/or said lower reflector including a semiconductor Bragg reflector, at least a part of said semiconductor distributed Bragg reflector comprising a semiconductor layer containing Al, Ga and As as major components, wherein there is provided, between said active layer and said semiconductor layer that contains Al, Ga and As as major components, a semiconductor layer containing Al, In and P as major components such that said semiconductor layer containing Al, In and P as major components is provided adjacent to said semiconductor layer that contains Al, Ga and As as major components, an interface between said semiconductor layer containing Al, Ga and As as major components and said semiconductor layer containing Al, In and P as major components being formed coincident to a location of a node of electric field strength distribution. - View Dependent Claims (37, 38, 39, 40)
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41. A surface-emission laser diode, comprising:
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a GaAs substrate; a cavity region formed over said GaAs substrate and having at least one quantum well active layer producing a laser light and barrier layers; and an upper reflector and a lower reflector provided at a top part and a bottom part of said cavity region over said GaAs substrate, said upper reflector and/or lower reflector including a semiconductor distributed Bragg reflector, at least a part of said semiconductor distributed Bragg reflector comprising a semiconductor layer containing Al, Ga and As as major components, there being provided, between said active layer and said semiconductor layer containing Al, Ga and As as major components, a (AlaGa1-a)bIn1-bP (0<
a≦
1, 0≦
b≦
1) layer adjacent to said semiconductor layer containing Al, Ga and As as major components,said (AlaGa1-a)bIn1-bP (0<
a≦
1, 0≦
b≦
1) layer being added with Mg (magnesium) as a p-type dopant,said semiconductor layer containing Al, Ga and As as major components being added with C (carbon) as a p-type dopant. - View Dependent Claims (42, 43, 44)
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45. A surface-emission laser diode, comprising:
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a GaAs substrate; a cavity region formed over said GaAs substrate, said cavity region including at least one quantum well active layer producing a laser light and barrier layers; and an upper reflector and a lower reflector provided at a top part and a bottom part of said cavity region over said GaAs substrate, said upper reflector and/or lower reflector including a semiconductor distributed Bragg reflector, at least a part of said semiconductor distributed Bragg reflector comprising a semiconductor layer containing Al, Ga and As as major components, there being provided, between said active layer and said semiconductor layer containing Al, Ga and As as major components, a (AlaGa1-a)bIn1-bP (0<
a≦
1, 0≦
b≦
1) layer adjacent to said semiconductor layer containing Al, Ga and As as major components,said (AlaGa1-a)bIn1-bP (0<
a≦
1, 0≦
b≦
1) layer being a semiconductor layer formed of a short period superlattice structure of AlInP and GaInP. - View Dependent Claims (46, 47, 48)
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Specification